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Research into the relationship between the surface topography, texture and mechanical properties of PVD-Cu/Ni multilayers

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Materials Science-Poland

Abstract

The paper presents the results of structural examinations and mechanical tests of Cu/Ni multilayers fabricated by the magnetron sputtering method. The investigated multilayers were differentiated by Ni sublayer thickness (1, 3 and 6 nm), while the retaining Cu sublayer thickness was unchanged (2 nm). Measurements demonstrated that the multilayers were strongly textured in the direction of their growth [111], with the thinnest multilayer (Cu/Ni = 2/1) showing a stronger texture. Stronger texturing was associated with greater surface roughness. Multilayers with the largest thickness had higher hardness and Young’s modulus. The properties of Cu/Ni multilayers depended both on the thickness of their sublayers, as well as on their total thickness.

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Authors and Affiliations

  1. Institute of Materials Engineering, Czestochowa University of Technology, al. Armii Krajowej 19, 42-200, Czestochowa, Poland

    B. Kucharska & E. Kulej

  2. Department of Metallurgy and Materials Engineering, Katholieke Universiteit Leuven, B-3001, Heverlee, Belgium

    G. Pyka

  3. Department of Electronics, AGH University of Science and Technology, 30 Mickiewicza Av., 30-059, Kraków, Poland

    J. Kanak & T. Stobiecki

Authors
  1. B. Kucharska
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  2. E. Kulej
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  3. G. Pyka
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  4. J. Kanak
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  5. T. Stobiecki
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Corresponding author

Correspondence to E. Kulej.

Additional information

This paper was presented at the 12th Seminar Surface and Thin-Film-Structures — SemPiSC, Szklarska Poreęba 2012

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Kucharska, B., Kulej, E., Pyka, G. et al. Research into the relationship between the surface topography, texture and mechanical properties of PVD-Cu/Ni multilayers. Mater Sci-Pol 31, 101–107 (2013). https://doi.org/10.2478/s13536-012-0078-0

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  • DOI: https://doi.org/10.2478/s13536-012-0078-0

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