Abstract.
Based on a 2-D thermal diffusivity equation, the temperature distributions for film/substrate bilayered structures induced by a transient thermal grating source are calculated by an eigenfunction expansion method, in which the interfacial thermal resistance is taken into account for obtaining the temperature fields in the structures. The results demonstrate that the eigenfunction expansion method is a new effective method to calculate analytically the temperature distributions of film/substrate structures and then to evaluate the thermal properties of film materials.
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Ju, Hy., Kuo, Pk. & Zhang, Sy. Transient thermal grating analyses of film/substrate structures by eigenfunction expansion method. Eur. Phys. J. Spec. Top. 153, 191–194 (2008). https://doi.org/10.1140/epjst/e2008-00425-5
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DOI: https://doi.org/10.1140/epjst/e2008-00425-5