Abstract
This paper investigates the dynamic behavior of a V-shaped atomic force microscope (AFM) beam using different polymers and immersion environments. Polystyrene (PS), polypropylene (PP), polycarbonate (PC), acrylonitrile butadiene styrene (ABS), and high-impact polystyrene (HIPS) polymers have been used as the polymeric samples. Based on the importance and applications of these polymers in micro- and nanotechnology, it is necessary to find the mechanical properties in nanoscale. Considering these samples for AFM beam as new research can be interesting. Nanoindentation for extension and retraction regimes has been done by NT-MDT SOLVER P47 scanning probe microscope. For calibration of computing in nanoscale, polyethylene and EPDM rubber have been applied. For the mathematical modeling of the dynamic behavior of the V-shaped AFM beam, Timoshenko beam theory has been applied, and for modeling the contact between beam and samples, DMT (Derjaguin–Muller–Toporov) contact theory has been used to consider the adhesion due to a soft sample. Air, water, methanol, and acetone have been considered as beam environments. Finite element modeling (FEM) has been used to obtain the frequency response function (FRF) and resonant frequency of the beam. Mathematica software (version 8) has been used for programming equations in FEM. The results show that increasing the elasticity modules of the samples increases the resonant frequency, but the amplitude of FRF of vertical movement of the beam declines. By increasing the liquid viscosity as the immersion environments, the resonant frequency amplitude of FRF of vertical movement of the beam decreases. The results of theoretical modeling have been compared with the experimental method (by JPK Instruments-Nano Wizard 2 Atomic Force Microscope). The results show agreement.
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Abbreviations
- A :
-
Area of the cross section
- AFM:
-
Atomic force microscope
- \(c_{a}\) :
-
Additional hydrodynamic damping for rectangular cantilever
- \(c^{\prime}_{a}\) :
-
Additional hydrodynamic damping for double tapered cantilever
- \(c_{\infty }\) :
-
Hydrodynamic damping for rectangular cantilever when the cantilever is vibrating in free liquid
- \(c^{\prime}_{\infty }\) :
-
Hydrodynamic damping for double tapered cantilever when the cantilever is vibrating in free liquid
- \(c_{s}\) :
-
Hydrodynamic damping for rectangular cantilever when the cantilever is close to the surface
- \(c^{\prime}_{s}\) :
-
Hydrodynamic damping for double tapered cantilever when the cantilever is close to the surface
- \(C_{b}\) :
-
Breadth taper ratio
- \(C_{h}\) :
-
Height taper ratio
- d :
-
Distance between the lower edge of the cantilever and the centroid of the cross section
- D:
-
Equilibrium tip–sample separation between the cantilever tip and the sample surface
- \(D_{0}\) :
-
Initial beam deflection
- E :
-
Young's modulus
- \(E_{r}\) :
-
Declined elastic modulus of the tip–sample contact
- \(E_{t}\) :
-
Young's modulus of the tip
- \(E_{s}\) :
-
Young's modulus of the sample
- \(F_{ts}\) :
-
Tip–sample force vector
- \(f_{ts}\) :
-
Forces and moments at contact node
- \(f_{t} ,f_{n}\) :
-
Interaction forces in tangential and normal directions of sample surface
- \(f_{{d_{1} }}\) :
-
Hydrodynamic force for rectangular cantilever
- \(f_{{d_{2} }}\) :
-
Hydrodynamic force for double tapered cantilever
- G :
-
Shear modulus
- \(G_{t}\) :
-
Shear modulus of the tip
- \(G_{s}\) :
-
Shear modulus s of the sample
- H :
-
Distance from the natural axis of the beam to the top of the tip
- \(h(x,t)\) :
-
The transient distance between the rectangular cantilever and the surface
- \(h^{\prime}(x,t)\) :
-
The transient distance between the double tapered cantilever and the surface
- I :
-
Moment of the cross section
- k :
-
Shear coefficient
- \(k_{c}\) :
-
Cantilever contact stiffness
- \(k_{n} ,k_{t}\) :
-
Linear normal and lateral contact stiffness of the sample surface
- \(k_{n1} ,k_{n2} ,k_{t1} ,k_{t2}\) :
-
Non-linear normal and lateral contact stiffness of the sample surface
- kAG :
-
Shear rigidity
- \(K_{T - S}\) :
-
Matrix stiffness coefficient of the tip–sample interaction force
- \(k_{c}\) :
-
Beam stiffness
- \(k_{ts}\) :
-
Matrix stiffness exacts at the end of cantilever
- \(m_{{{\text{tip}}}}\) :
-
Tip mass
- N :
-
The number of total discrete grid points in the domain
- P :
-
Applied force
- r :
-
Timoshenko beam parameter to describe the rotatory inertia effect
- \(R_{t}\) :
-
Tip radius
- s :
-
Parameter to describe the shear deformation effect
- t :
-
Time
- w :
-
Transverse deflection of the cantilever
- x :
-
Longitudinal coordinate
- y :
-
General transverse deflection of the cantilever
- t :
-
Time
- \(Z_{0}\) :
-
Surface offset
- \(\xi\) :
-
Longitudinal coordinate parameter for the cantilever
- α :
-
Angle between the cantilever and sample surface
- λ :
-
Non dimensional resonant frequency parameter
- ρ :
-
Mass density
- \(\rho_{a}\) :
-
Additional mass density
- ρA :
-
Mass per unit length
- \(\mu\) :
-
Dimensionless
- Φ,:
-
Bending angles of the cantilever
- ω :
-
Circular resonant frequency
- \(\Lambda\) :
-
Tip–sample contact stiffness
- \(\delta\) :
-
Vertical displacement of piezoelectric scanner
- \(\delta^{\prime}\) :
-
Vertical displacement of tip
- \(\delta_{0}\) :
-
Static contact deformation
- \(\eta\) :
-
Density of the liquid
- ν :
-
Poisson's ratio
- \(\nu_{t}\) :
-
Poisson’s ratio of the tip
- \(\nu_{s}\) :
-
Poisson’s ratio of the sample
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Appendices
Appendix A. Timoshenko beam model
Here mass, stiffness, and damping matrices (Fig. 27) are introduced using Timoshenko beam principle [24]:
where \([m_{t} ]_{e}\) and \([m_{r} ]_{e}\) represent the mass matrix for shear inertia and rotatory inertia effects, respectively.
where \(\phi = \frac{12\,EI}{{kGA\,L^{2} }},A_{i} = \frac{{EI_{i} - EI_{j} }}{{EI_{i} + EI_{j} }},\quad \overline{EI} = (EI_{i} + EI_{j} )/2\). We employ the proportional damping matrix as [13]:
Appendix B. Hamaker constant
Based on the EDLVO principle, \(A_{132}\) as the Hamaker constant between material 1 and 2 in the medium 3 can be expressed as [15]:
Here, silicon tip has been supposed as the material 2 and polymeric samples are considered as the material 1. Air, water, methanol, and acetone have been used as the medium. Based on [15, 16], Table 8 cab be expressed as:
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Rezaei, I., Sadeghi, A. Vibrational behavior of atomic force microscope beam via different polymers and immersion environments. Eur. Phys. J. Plus 137, 72 (2022). https://doi.org/10.1140/epjp/s13360-021-02283-1
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DOI: https://doi.org/10.1140/epjp/s13360-021-02283-1