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Analysis of structural and optical properties of annealed fullerene thin films

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Abstract

Fullerene thin films were thermally deposited onto different substrates. The films annealed at 523 K for 10 h. X-ray diffraction technique was used to examine the structure of the films. The morphology of films was examined by field emission scanning electron microscopy. Fourier transform infrared spectra were recorded in wavenumber range 400–2000 cm−1. The optical characteristics were analyzed using UV- Vis-NIR spectrophotometric measurements in the spectral range 200–2500 nm. The refractive index and extinction coefficient were determined. Some dispersion parameters were calculated such as single oscillator energy, dispersion energy, dielectric constant at high frequency and lattice dielectric constant. As well as, the nonlinear optical susceptibility χ (3) and nonlinear refractive index n 2 were determined.

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Authors and Affiliations

  1. Physics Department, Faculty of Education, Ain Shams University, 11757, Roxy, Cairo, Egypt

    M. M. El-Nahass & H. A. M. Ali

  2. Department of Laser Sciences and Interactions, National Institute of Laser Enhanced Sciences, Cairo University, Giza, 12613, Egypt

    A.-S. Gadallah, M. Atta Khedr & H. A. Afify

Authors
  1. M. M. El-Nahass
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  2. H. A. M. Ali
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  3. A.-S. Gadallah
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  4. M. Atta Khedr
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  5. H. A. Afify
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Correspondence to H. A. M. Ali.

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El-Nahass, M.M., Ali, H.A.M., Gadallah, AS. et al. Analysis of structural and optical properties of annealed fullerene thin films. Eur. Phys. J. D 69, 200 (2015). https://doi.org/10.1140/epjd/e2015-60174-8

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