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Negative ion photoelectron spectroscopy of 2,2’-bithiophene cluster anions, (2T)n- (n = 1–100)

  • Optical Properties and Optoelectronics; Magnetism and Spintronics
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Abstract.

Cluster anions of 2,2’-bithiophene, (2T)n-, were produced up to n ∼500 in the gas-phase. The energetics of the excess electron in the (2T)n- clusters with n =1-100 were explored by negative ion photoelectron spectroscopy. When the vertical detachment energies (VDEs) obtained from the photoelectron spectra were analyzed by a plot against n-1/3, it has been revealed that the excess electron trapping level thus extrapolated is located at ∼0.8 eV below the conduction band minimum (i.e. LUMO) of the 2T thin film. The large slope of the VDEs vs. n-1/3 plot suggests that the neutral 2T molecules surrounding the anion core take non-planar twisted conformations with permanent dipole moments, resulting in the exceedingly deep trapping of the excess electron in the 2T cluster anions.

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Authors and Affiliations

  1. Department of Chemistry, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, 223-8522, Japan

    M. Mitsui, Y. Matsumoto, N. Ando & A. Nakajima

  2. CREST, Japan Science and Technology Agency, c/o Department of Chemistry, Keio University, Yokohama, 223-8522, Japan

    A. Nakajima

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  1. M. Mitsui
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  2. Y. Matsumoto
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  3. N. Ando
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  4. A. Nakajima
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Correspondence to A. Nakajima.

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Mitsui, M., Matsumoto, Y., Ando, N. et al. Negative ion photoelectron spectroscopy of 2,2’-bithiophene cluster anions, (2T)n- (n = 1–100). Eur. Phys. J. D 34, 169–172 (2005). https://doi.org/10.1140/epjd/e2005-00139-0

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  • DOI: https://doi.org/10.1140/epjd/e2005-00139-0

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