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Fine mapping of a resistance gene to bacterial leaf pustule in soybean

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Abstract

Soybean bacterial leaf pustule (BLP) is a prevalent disease caused by Xanthomonas axonopodis pv. glycines. Fine mapping of the BLP resistant gene, rxp, is needed to select BLP resistant soybean cultivars by marker-assisted selection (MAS). We used a total of 227 recombinant inbred lines (RILs) derived from a cross between ‘Taekwangkong’ (BLP susceptible) and ‘Danbaekkong’ (BLP resistant) for rxp fine mapping and two different sets of near isogenic lines (NILs) from Hwangkeumkong × SS2-2 and Taekwangkong × SS2-2 were used for confirmation. Using sequences between Satt372 and Satt486 flanking rxp from soybean genome sequences, eight simple sequence repeats (SSR) and two single nucleotide polymorphism (SNP) markers were newly developed in a 6.2-cM interval. Linkage mapping with the RILs and NILs allowed us to map the rxp region with high resolution. The genetic order of all markers was completely consistent with their physical order. QTL analysis by comparison of the BLP phenotyping data with all markers showed rxp was located between SNUSSR17_9 and SNUSNP17_12. Gene annotation analysis of the 33 kb region between SNUSSR17_9 and SNUSNP17_12 suggested three predicted genes, two of which could be candidate genes of BLP resistance: membrane protein and zinc finger protein. Candidate genes showed high similarity with their paralogous genes, which were located on the duplicated regions obtaining BLP resistance QTLs. High-resolution map in rxp region with eight SSR and two SNP markers will be useful for not only MAS of BLP resistance but also characterization of rxp.

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Acknowledgments

This work was supported by the Agricultural R&D Promotion Center, Ministry for Food, Agriculture, Forestry, and Fisheries, Republic of Korea (grant no. 305005–4), by the Crop Functional Genomics Center of the 21st Century Frontier R&D Program funded by the Ministry of Education, Science, and Technology, Republic of Korea (grant no. CG3121), by the BioGreen 21 Project, Rural Development Administration, Republic of Korea (grant no. 20080401034011 for DNA sequencing).

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Authors and Affiliations

  1. Department of Plant Science and Research Institute for Agriculture and Life Sciences, Seoul National University, Seoul, 151-921, Korea

    Dong Hyun Kim, Kil Hyun Kim, Kyujung Van, Moon Young Kim & Suk-Ha Lee

  2. Plant Genomics and Breeding Institute, Seoul National University, Seoul, 151-921, Korea

    Suk-Ha Lee

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  1. Dong Hyun Kim
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  2. Kil Hyun Kim
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  4. Moon Young Kim
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Correspondence to Suk-Ha Lee.

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Communicated by H. T. Nguyen.

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Kim, D.H., Kim, K.H., Van, K. et al. Fine mapping of a resistance gene to bacterial leaf pustule in soybean. Theor Appl Genet 120, 1443–1450 (2010). https://doi.org/10.1007/s00122-010-1266-0

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