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Ultrafast Transmission Electron Microscopy and Electron Diffraction

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Book cover In-situ Materials Characterization

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 193))

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Abstract

The development and application of pump-probe instrumentation to study rather complex transient events in the solid state, soft matter and life sciences domains has been an area of enormous interest recently. For many years the emphasis has been on the laser-pump and laser-probe approach, followed by the laser-pump and x-ray probe approach. Lately, another method, the laser-pump electron-probe technique, has been gaining interest. Very early experiments using this technique have used electrons to explore gas-phase diffraction of photo-stimulated chemical reactions, followed by experiments in the solid state domain, studying for example, rapid phase transformations, solidification processes, twinning, and shock propagation. The following chapter will focus on the emerging area of ultrafast transmission electron microscopy, or simply ultrafast electron microscopy (UEM), as well as on ultrafast electron diffraction (UED). The topics included are electron sources for pulsed operation and the appropriate emitter materials for this application, electron pulse propagation, electron- and laser-material interactions, the operational challenges during an UEM or UED experiment, i.e., time-resolution and synchronization, the experimental variations, and the challenges encountered when attempting to detect ultrafast experimental processes.

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References

  1. W. S. Fann, R. Storz, H.W.K. Tom, J. Bokor, Phys. Rev. B 46, 13–592 (1992)

    Google Scholar 

  2. D.M. Riffe, X.Y. Wang, M.C. Downer, D.L. Fisher, T. Tjima, J.L. Erskine, R.M. More, J. Opt. Soc. Am. B 10, 1424 (1993)

    Article  ADS  Google Scholar 

  3. M. Merschdorf, W. Pfeiffer, S. Voll, G. Gerber, Phys. Rev. B 68, 155416 (2003)

    Article  ADS  Google Scholar 

  4. Y.C. Martin, H.F. Hamann, H.K. Wickramasinghe, J. Appl. Phys. 89, 5774 (2001)

    Article  ADS  Google Scholar 

  5. A.W. Baum, J.E. Schneider, R.F.W. Pease, M.A. McCord, W.E. Spicer, K.A. Costello, V.W. Aebi, J. Vac. Sci. Tech. B 15, 2702 (1997)

    Article  Google Scholar 

  6. European Patent No.EP0834896B1, filed 02.10.1996, granted 12.06.2002 to Rainer Spehr, Michael Schmitt, Jürgen Frosien

    Google Scholar 

  7. B.J. Siwick, A.A. Green, C.T. Hebeisen, R.J.D. Miller, Opt. Lett. 30, 1057 (2005)

    Article  ADS  Google Scholar 

  8. B.J. Siwick, J.R. Dwyer, R.E. Jordan, R.J.D. Miller, Chem. Phys. 299, 285 (2004)

    Article  ADS  Google Scholar 

  9. B.J. Siwick, J.R. Dwyer, R.E. Jordan, R.J.D. Miller, J. Appl. Phys. 92, 1643 (2002)

    Article  ADS  Google Scholar 

  10. T. van Oudheusden, E.F. de Jong, S.B. van der Geer, W.P.E.M. Op’t Root, O.J. Luiten, B.J. Siwick, J. Appl. Phys. 102, 093501 (2007)

    Article  ADS  Google Scholar 

  11. P. Baum, A.H. Zewail, Chem. Phys. Lett. 462, 14 (2008)

    Article  ADS  Google Scholar 

  12. A.H. Zewail, Annu. Rev. Phys. Chem. 57, 65 (2006)

    Article  ADS  Google Scholar 

  13. P. Baum, D.S. Yang, A.H. Zewail, Science 318, 788 (2007)

    Article  ADS  Google Scholar 

  14. R. Srinivasan, V.A. Lobastov, C.Y. Ruan, A.H. Zewail, Helv. Chim. Acta 86, 1763 (2003)

    Article  Google Scholar 

  15. H. Dömer, O. Bostanjoglo, Rev. Sci. Instrum. 74, 4369 (2003)

    Article  ADS  Google Scholar 

  16. H. Dömer, O. Bostanjoglo, Microsc. Microanal. 9, 358 (2003)

    Google Scholar 

  17. H. Dömer, O. Bostanjoglo, Adv. Eng. Mater. 4, 623 (2002)

    Article  Google Scholar 

  18. H. Dömer, O. Bostanjoglo, Appl. Surf. Sci. 208, 442 (2003)

    Article  ADS  Google Scholar 

  19. T. LaGrange, G.H. Campbell, P.E.A. Turchi, W.E. King, Acta Mater. 55, 5211 (2007)

    Article  Google Scholar 

  20. T. LaGrange, Appl. Phys. Lett. 89, 044105 (2006)

    Article  ADS  Google Scholar 

  21. G.H. Campbell, Microsc. Microanal. 12, 1428CD (2006)

    Google Scholar 

  22. N.D. Browning, Microsc. Microanal. 12, 790CD (2006)

    Google Scholar 

  23. T. LaGrange, G.H. Campbell, J.D. Colvin, B. Reed, W.E. King, J. Mater. Sci. 41, 4440 (2006)

    Article  ADS  Google Scholar 

  24. M.R. Armstrong, K. Boyden, N.D. Browning, G.H. Campbell, J.D. Colvin, W.J. DeHope, A.M. Frank, D.J. Gibson, F. Hartemann, J.S. Kim, W.E. King, T.B. LaGrange, B.J. Pyke, B.W. Reed, R.M. Shuttlesworth, B.C. Stuart, B.R. Torralva, Ultramicroscopy 107, 356 (2007)

    Article  Google Scholar 

  25. H. Kleinschmidt, A. Ziegler, G.H. Campbell, J.D. Colvin, O. Bostanjoglo, J. Appl. Phys. 98, 054313 (2005)

    Article  ADS  Google Scholar 

  26. O. Bostanjoglo, Adv. Imaging Electron Phys. 121, 1 (2002)

    Article  Google Scholar 

  27. S.I. Anisimov, B.L. Kapeliovich, T.L. Perelman, Sov. Phys. JETP 39, 375 (1974)

    ADS  Google Scholar 

  28. M.I. Kaganov, I.M. Lifshitz, L.V. Tanatarov, Sov. Phys. JETP 4, 173 (1957)

    MATH  Google Scholar 

  29. B. Rethfeld, A. Kaiser, M. Vicanek, G. Simon, Proc. SPIE 3343, 388 (1998)

    Article  ADS  Google Scholar 

  30. B. Rethfeld, H. Krutsch, D.H.H. Hoffmann, Contrib. Plasma Phys. 50, 16 (2010)

    Article  ADS  Google Scholar 

  31. T. Feuerer, H. Langhoff, Appl. Phys. A 63, 13 (1996)

    Article  ADS  Google Scholar 

  32. S. Nolte, C. Momma, B.N. Chichkov, H. Wellig, Phys. Blätter 55, 41 (1999)

    Article  Google Scholar 

  33. G.A. Mourou, T. Tajima, S.V. Bulanov, Rev. Mod. Phys. 78, 309 (2006)

    Article  ADS  Google Scholar 

  34. T.H. Her, R.J. Finlay, C. Wu, S. Deliwala, E. Mazur, Appl. Phys. Lett. 73, 1673 (1998)

    Article  ADS  Google Scholar 

  35. T.H. Her, R.J. Finlay, C. Wu, E. Mazur, Appl. Phys. A 70, 383 (2000)

    Article  ADS  Google Scholar 

  36. C. Wu, C.H. Crouch, L. Zhao, J.E. Carey, R. Younkin, J.A. Levinson, E. Mazur, R.M. Farrell, P. Gothoskar, A. Karger, Appl. Phys. Lett. 78, 1850 (2001)

    Article  ADS  Google Scholar 

  37. F. Sanchez, J.L. Morenza, R. Aguiar, J.C. Delgado, M. Varela, Appl. Phys. Lett. 69, 620 (1996)

    Article  ADS  Google Scholar 

  38. A.J. Pedraza, J.D. Fowlkes, D.H. Lowndes, Appl. Phys. Lett. 77, 3018 (2000)

    Article  ADS  Google Scholar 

  39. A.J. Pedraza, J.D. Fowlkes, S. Jesse, C. Mao, H. Lowndes, Appl. Surf. Sci. 168, 251 (2000)

    Article  ADS  Google Scholar 

  40. A.J. Pedraza, J.D. Fowlkes, D.H. Lowndes, Appl. Phys. Lett. 74, 2322 (1999)

    Article  ADS  Google Scholar 

  41. R.J. Younkin, J.E. Carey, E. Mazur, J.A. Levinson, C.M. Friend, J. Appl. Phys. 93, 2626 (2003)

    Article  ADS  Google Scholar 

  42. B. Koopmans, G. Malinowski, F.D. Longa, D. Steiauf, M. Fähnle, T. Roth, M. Cinchetti, M. Aeschlimann, Nat. Mater. 9, 259 (2010)

    ADS  Google Scholar 

  43. D. Ashkenasi, A. Rosenfeld, H. Varel, M. Waehmer, E.E.B. Campbell, Appl. Surf. Sci. 120, 65 (1997)

    Article  ADS  Google Scholar 

  44. B. Luk’Yanchuk, N. Bityurin, S. Anisimov, D. Baeuerle, Appl. Phys. A 57, 367 (1993)

    Google Scholar 

  45. P.T.C. So, H. Kim, I.E. Kochevar, Opt. Exp. 3, 339 (1998)

    Article  ADS  Google Scholar 

  46. N. Shen, D. Datta, C.B. Schaffer, P. LeDuc, D.E. Ingber, E. Mazur, Mech. Chem. Biosyst. 2, 17 (2005)

    Google Scholar 

  47. A. Heisterkamp, I.Z. Maxwell, E. Mazur, J.M. Underwood, J.A. Nickerson, S. Kumar, D.E. Ingber, Opt. Exp. 13, 3690 (2005)

    Article  ADS  Google Scholar 

  48. K. Koenig, I. Riemann, P. Fischer, K. Halbhuber, Cell. Mol. Biol. 45, 192 (1995)

    Google Scholar 

  49. U.K. Tirlapur, K. Koenig, Nature 448, 290 (2002)

    Article  ADS  Google Scholar 

  50. W. Watanabe, N. Arakawa, S. Matsunaga, T. Higashi, K. Fukui, K. Isobe, K. Itoh, Opt. Exp. 12, 4203 (2004)

    Article  ADS  Google Scholar 

  51. A. Vogel, V. Venugopalan, Chem. Rev. 103, 577 (2003)

    Article  Google Scholar 

  52. M. Martyniuk, J. Antoszewski, C.A. Musca, J.M. Dell, L. Faraone, Smart Mater. Struct. 15, S29 (2006)

    Article  ADS  Google Scholar 

  53. J. Cao, Z. Hao, H. Park, C. Tao, D. Kau, L. Blaszczyk, Appl. Phys. Lett. 83, 1044 (2003)

    Article  ADS  Google Scholar 

  54. Z. Chang, A. Rundquist, J. Zhou, M.M. Murnane, H.C. Kapteyn, X. Liu, B. Shan, J. Liu, L. Niu, M. Gong, X. Zhang, Appl. Phys. Lett. 69, 133 (1996)

    Article  ADS  Google Scholar 

  55. J.C. Diels, W. Rudolph: Ultrashort Laser Pulse Phenomena: Fundamentals, Techniques, and Applications on a Femtosecond Time Scale, 2nd edn. (Academic Press, Elsevier, 2006)

    Google Scholar 

  56. P. Baum, A.H. Zewail, Proc. Nat. Acad. Sci. 103, 16105 (2006)

    Article  ADS  Google Scholar 

  57. W.E. King, G.H. Campbell, A. Frank, B. Reed, J.F. Schmerge, B.J. Siwick, B.C. Stuart, P.M. Weber, J. Appl. Phys. 97, 111101 (2005)

    Article  ADS  Google Scholar 

  58. D. Shorokhov, A.H. Zewail, Phys. Chem. Chem. Phys. 10, 2879 (2008)

    Article  Google Scholar 

  59. Z. Bor, B. Racz, G. Szabo, M. Hilbert, H.A. Hazim, Opt. Eng. 32, 2501 (1993)

    Article  ADS  Google Scholar 

  60. J. Hebling, Opt. Quantum Electron 28, 1759 (1996)

    Article  Google Scholar 

  61. C. Dorrer, E. M. Kosik, I. A. Walmsley, Appl. Phys. B 74(suppl.), 209 (2002)

    Google Scholar 

  62. Z. Bor, B. Racz, Opt. Commun. 54, 165 (1985)

    Article  ADS  Google Scholar 

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Authors and Affiliations

  1. Microscopy and Microanalysis Unit, The University of the Witwatersrand, 1 Jan Smuts Ave., Johannesburg, 2000, South Africa

    Alexander Ziegler

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  1. Alexander Ziegler
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Correspondence to Alexander Ziegler .

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Editors and Affiliations

  1. Microscopy & Microanalysis Unit, The University of the Witwatersrand, Johannesburg, Germany

    Alexander Ziegler

  2. Photon-Science Detector Group, Deutsches Elektronen Synchrotron, Hamburg, Germany

    Heinz Graafsma

  3. Nanotechnology Systems Division, Hitachi High Technologies America, Inc., Pleasanton, California, USA

    Xiao Feng Zhang

  4. Leiden University Kamerlingh Onnes Laboratory, Leiden, The Netherlands

    Joost W.M. Frenken

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Ziegler, A. (2014). Ultrafast Transmission Electron Microscopy and Electron Diffraction. In: Ziegler, A., Graafsma, H., Zhang, X., Frenken, J. (eds) In-situ Materials Characterization. Springer Series in Materials Science, vol 193. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-45152-2_4

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  • DOI: https://doi.org/10.1007/978-3-642-45152-2_4

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