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Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 212))

Abstract

According to the requirement of metrology support of test systems, the concept of measurability, which is a key problem, is firstly put forward by us. The connotation of measurability is explained, and its indexes, which include the quantitative and qualitative aspects, are presented. The relations of measurability and RMS (reliability, maintainability, supportability, testability and security) are analysed. The key problems of measurability are proposed, which include metrology interface, metrology items, modle of design and evaluation, and lengthening of calibration interval.

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Correspondence to Jing Wang .

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© 2013 Springer-Verlag Berlin Heidelberg

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Wang, J., Zhang, Q., Jiang, W. (2013). Measurability: A Key Problem for Test Systems. In: Lu, W., Cai, G., Liu, W., Xing, W. (eds) Proceedings of the 2012 International Conference on Information Technology and Software Engineering. Lecture Notes in Electrical Engineering, vol 212. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-34531-9_12

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  • DOI: https://doi.org/10.1007/978-3-642-34531-9_12

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-34530-2

  • Online ISBN: 978-3-642-34531-9

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