Skip to main content
SpringerLink
Log in
Book cover

International Conference on Nano-Networks

NanoNet 2008: Nano-Net pp 26–27Cite as

Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors

  • Conference paper

  • 708 Accesses

Abstract

We show results from ongoing work studying the interaction of process variation and built-in fault resilience intended to handle defects. We find that built-in fault resilience decreases the negative effects of process variation on a streaming nanoprocessor design.

This is a preview of subscription content, log in via an institution.

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

References

  1. Moritz, C.A., Wang, T., Narayanan, P., Leuchtenburg, M., Guo, Y., Dezan, C., Ben-Naser, M.: Fault-Tolerant Nanoscale Processors on Semiconductor Nanowire Grids. IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications 54, 2422–2437 (2007)

    Article  Google Scholar 

  2. Garnett, E., Liang, W., Yang, P.: Growth and Electrical Characteristics of Platinum-Nanoparticle-Catalyzed Silicon Nanowires. Advanced Materials 19, 2946–2950 (2007)

    Article  CAS  Google Scholar 

  3. Dehon, A.: Nanowire-based Programmable Architectures. J. Emerg. Technol. Comput. Syst. 1, 109–162 (2005)

    Article  Google Scholar 

  4. Lu, W., Lieber, C.M.: Semiconductor Nanowires. Journal of Physics D: Applied Physics 39, R387–R406 (2006)

    Article  Google Scholar 

  5. Wu, Y., Xiang, J., Chen, Y., Lu, W., Lieber, C.M.: Single-crystal Metallic Nanowires and Metal/Semiconductor Nanowire Heterostructures. Nature 430, 61–65 (2004)

    Article  CAS  PubMed  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. UMass Amherst, Amherst, MA, 01002, USA

    Michael Leuchtenburg, Pritish Narayanan, Teng Wang & Csaba Andras Moritz

Authors
  1. Michael Leuchtenburg
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Pritish Narayanan
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Teng Wang
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. Csaba Andras Moritz
    View author publications

    You can also search for this author in PubMed Google Scholar

Editor information

Editors and Affiliations

  1. 325 Computer Science Bldg., 500 West 15th Street, MO 65409-0350, Rolla, USA

    Maggie Cheng

Rights and permissions

Reprints and permissions

Copyright information

© 2009 ICST Institute for Computer Science, Social Informatics and Telecommunications Engineering

About this paper

Cite this paper

Leuchtenburg, M., Narayanan, P., Wang, T., Moritz, C.A. (2009). Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors. In: Cheng, M. (eds) Nano-Net. NanoNet 2008. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, vol 3. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-02427-6_6

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-02427-6_6

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-02426-9

  • Online ISBN: 978-3-642-02427-6

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics

Search

Navigation