Abstract
The following table gives threshold energies E k (in eV) of the ionization edges observable by EELS, based on data of Bearden and Burr (1967), Siegbahn et al. (1967), Zaluzec (1981), Ahn and Krivanek (1983), and Colliex (1985). The most prominent edges (those most suitable for elemental analysis) are shown in italics. Where possible, an accompanying symbol is used to indicate the observed edge shape:
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References
Ahn, C. C., and Krivanek, O. L. (1983) EELS Atlas, Arizona State University and Gatan Inc., Tempe, AZ
Bearden, J. A., and Burr, A. F. (1967) X-ray atomic energy levels. Rev. Mod. Phys. 39, 125–142.
Colliex, C. (1985) An illustrated review on various factors governing the high spatial resolution capabilities in EELS microanalysis. Ultramicroscopy 18, 131–150.
Siegbahn, K., Nordling, C., Fahlman, A., Nordberg, R., Hamrin, K., Hedman, J., Johansson, G., Bergmark. T., Karlsson, S., Lindgren, I., and Lindberg, B. (1967) Electron Spectroscopy for Chemical Analysis, Almqvist and Wiksell, Uppsala.
Zaluzec, N. J. (1981) A reference library of electron energy-loss spectra. In Analytical Electron Microscopy – 1981, ed. R. H. Geiss, San Francisco Press, San Francisco, CA, pp. 193–194. Updated version available (free) from the author at: Materials Science Division, Argonne National Laboratory, Illinois 60439.
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Egerton, R. (2011). Inner-Shell Energies and Edge Shapes. In: Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-9583-4_9
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DOI: https://doi.org/10.1007/978-1-4419-9583-4_9
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