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Magnetic Microscopy of Nanostructures pp 137–167Cite as

SEMPA Studies of Thin Films, Structures, and Exchange Coupled Layers

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Part of the book series: NanoScience and Technology ((NANO))

Abstract

Scanning electron microscopy with polarization analysis (SEMPA) has developed into a powerful technique to study domains in ultrathin films. In this chapter, we discuss from a very general point of view the instrumental aspects of the method. Examples of thin film investigations are given that demonstrate unique features of SEMPA. New solutions around apparent limitations of the technique are presented at the end, i.e., analyzing samples with contaminated surfaces and imaging in external fields.

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Authors
  1. H.P. Oepen
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  2. H. Hopster
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Editors and Affiliations

  1. Department of Physics and Astronomy, University of California, Irvine, CA, 92697, USA

    Herbert Hopster

  2. Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Universität Hamburg, Jungiusstr. 11, 20355, Hamburg, Germany

    Hans Peter Oepen

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Oepen, H., Hopster, H. (2005). SEMPA Studies of Thin Films, Structures, and Exchange Coupled Layers. In: Hopster, H., Oepen, H.P. (eds) Magnetic Microscopy of Nanostructures. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-26641-0_7

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