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Bayesian Consideration of the Tomography Problem

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Part of the book series: Fundamental Theories of Physics ((FTPH,volume 70))

Abstract

Soft X-ray tomography has become a standard diagnostic equipment to investigate plasma profiles. Due to limitations in viewing-access and detector numbers the reconstruction of the two-dimensional emissivity profile constitutes a highly underdetermined inversion problem. We discuss the principle features of the tomography problem from the Bayesian point of view in various stages of sophistication. The approach is applied to real-world data obtained from the Wendelstein 7AS stellerator.

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Reference

  1. A.P.Navarro, V.K. Paré, and J.L. Dunlap, Rev.Sci.Instrum. 52, 1634 (1981)

    Article  Google Scholar 

  2. R.S. Granetz and J. Camacho, Nucl. Fusion 25, 727 (1985).

    Article  Google Scholar 

  3. J. Camacho and R.S. Granetz, Rev.Sci.Instrum. 57, 417 (1986).

    Article  Google Scholar 

  4. N.R. Sauthoff,K.M. McGuire, and S. von Goeler, Rev.Sci.Instrum. 57, 2139 (1986).

    Article  Google Scholar 

  5. E.T. Jaynes, (1958).

    Google Scholar 

  6. S.F. Gull, in Maximum Entropy and Bayesian Methodsed. J. Skilling, (Kluwer, Academic Publishers, 1989 ).

    Google Scholar 

  7. J. Skilling, in Maximum Entropy and Bayesian Methodsed. P. F. Fougère, (Kluwer, Academic Publishers, 1990 ).

    Google Scholar 

  8. R. Silver, in Maximum Entropy and Bayesian Methods ed. G. Heidbreder, (Kluwer, Academic Publishers, 1993), to be published.

    Google Scholar 

  9. B. Roy Frieden, J. Opt.Soc.Am. 62, 511 (1972)

    Article  Google Scholar 

  10. G.A.Cottrell, in Maximum Entropy in Action, ed. B. Buck and V. A. Macaulay, (Oxford Science Publications,Oxford 1990)

    Google Scholar 

  11. A. Holland and G.A.Navrati, Rev.Sci.Instrum. 57, 1557 (1986).

    Article  Google Scholar 

  12. K. Bockasten, J.Opt.Soc.Amer. 51, 943 (1961).

    Article  Google Scholar 

  13. N.R. SauthofT, S. von Goeler, and W. Stodiek, Nucl. Fusion 18, 1445 (1978).

    Article  Google Scholar 

  14. N.R. SauthofT and S. von Goeler, IEEE Trans.Plasma.Sci. 7, 141 (1979).

    Article  Google Scholar 

  15. A.P. Navarro, M.A. Ochando, and A. Weiler, IEEE Trans, on Plasma Science 19, 569 (1991).

    Article  Google Scholar 

  16. R. Decoste, Rev.Sci.Instrum. 56, 807 (1985).

    Article  Google Scholar 

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© 1996 Kluwer Academic Publishers

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von der Linden, W., Ertl, K., Dose, V. (1996). Bayesian Consideration of the Tomography Problem. In: Skilling, J., Sibisi, S. (eds) Maximum Entropy and Bayesian Methods. Fundamental Theories of Physics, vol 70. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-0107-0_5

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  • DOI: https://doi.org/10.1007/978-94-009-0107-0_5

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-6534-4

  • Online ISBN: 978-94-009-0107-0

  • eBook Packages: Springer Book Archive

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