Abstract
A 130 nm test chip containing an adiabatic FIR filter is designed and shows that adiabatic systems can be implemented within an industrial design flow. The structure of the FIR filter and the peripheral components allowing to supply and access data to and from the chip are described in detail. Measurement results of the fabricated chips are obtained and opposed to simulation results of a comparable static CMOS implementation. Voltage scaling results are gained by measurements.
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Teichmann, P. (2012). Measurement Results of an Adiabatic FIR Filter. In: Adiabatic Logic. Springer Series in Advanced Microelectronics, vol 34. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-2345-0_7
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DOI: https://doi.org/10.1007/978-94-007-2345-0_7
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-007-2344-3
Online ISBN: 978-94-007-2345-0
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