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Parameter Extraction and Validation of an Electronic and Optical Model for Organic Light-emitting Devices

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Book cover Simulation of Semiconductor Processes and Devices 2004

Abstract

Organic light-emitting devices (OLEDs) consist of a stack of multiple thin film layers whose thicknesses influence both the optical and electronic performance. Upon injection and transport, the charge carriers may recombine to form excitons that diffuse and decay radiatively, thus leading to distinct recombination and emission zone profiles. We present systematic combinatorial experiments for parameter extraction and validation of our comprehensive device model. The electronic model is based on drift-diffusion combined with exciton diffusion and decay. The optical part of the model considers the emission to originate from embedded radiative dipoles. We demonstrate the extraction of mobility parameters and energy barriers and validate the optical model using angular emission as well as photoluminescence data.

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References

  1. T. A. Beierlein, B. Ruhstaller, DJ. Gundlach, H. Riel, S. Karg, C. Rost, W. Riess, ”Investigation of internal processes in organic light-emitting devices using thin sensing layers”, Synth. Met., vol. 138, pp. 213–21, (2003)

    Article  Google Scholar 

  2. H. Riel, S. Karg, T. Beierlein, W. Riess, and K. Neyts, „Tuning the emission characteristics of top-emitting organic light-emitting devices by means of a dielectric capping layer: An experimental and theoretical study”, J. Appl. Phys., vol. 94, pp. 5290–96, (2003)

    Article  Google Scholar 

  3. J.M. Leger, S.A. Carter, B. Ruhstaller, H.-G. Nothofer, U. Scherf, H. Tillman, H.H. Hörhold, “Thickness-dependent changes in the optical properties of PPV— and PF-based polymer light emitting diodes”, Phys. Rev. B, vol. 68, 054209 (2003)

    Article  Google Scholar 

  4. B. Ruhstaller, T.A. Beierlein, H. Riel, S. Karg, J.C. Scott, W. Riess, “Simulating electronic and optical processes in multilayer organic light-emitting devices”, IEEE Journal on Selected Topics in Quantum Electronics, Optoelectronic Device Simulation, vol. 9 no. 3, pp. 723–732, (2003)

    Article  Google Scholar 

  5. B. Ruhstaller, S.A. Carter, S. Barth, H. Riel, W. Riess, J.C. Scott “Transient and steadystate behavior of space charges in multilayer organic light-emitting diodes”, J. Appl. Phys., vol. 89, pp. 4575–86, (2001)

    Article  Google Scholar 

  6. ETFOS Emissive Thin Film Optics Simulator, Center for Computational Physics, Switzerland, www.ccp.zhwin.ch, (2004)

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© 2004 Springer-Verlag Wien

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Ruhstaller, B. et al. (2004). Parameter Extraction and Validation of an Electronic and Optical Model for Organic Light-emitting Devices. In: Wachutka, G., Schrag, G. (eds) Simulation of Semiconductor Processes and Devices 2004. Springer, Vienna. https://doi.org/10.1007/978-3-7091-0624-2_37

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  • DOI: https://doi.org/10.1007/978-3-7091-0624-2_37

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-7091-7212-4

  • Online ISBN: 978-3-7091-0624-2

  • eBook Packages: Springer Book Archive

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