Abstract
So far in this volume, we have neglected a seemingly obvious effect in PES, namely the scattering of the photoexcited electron on its way through the crystal to the surface, by the crystal potential. This is a straightforward scattering problem leading to intensity modulations as a function of electron wavelength and/or crystal orientation. Such intensity modulations have indeed been observed and the method of measuring PES in order to bring out most clearly the scattering features of the final-state electron intensity is called PhotoElectron Diffraction (PED).
Keywords
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
T.M. Hayers, J.B. Boyce: Solid State Physics 37, 173 ( Academic, New York 1982 )
D.C. Koningsberger, R. Prins (eds.): Principles, Applications, Techniques of EXAFS, SEXAFS and XANES ( Wiley, New York 1988 )
For a recent comprehensive treatment of NEXAFS spectroscopy see J. Stöhr: NEXAFS Spectroscopy, Springer Ser. Surf. Sci., Vol.25 (Springer, Berlin, Heidelberg 1992 ); NEXAFS means that the EXAFS experiment is performed only near the absorption threshold
J.J. Rehr, J. Mustre de Leon, S.I. Zabinsky, R.C. Albers: J. Am. Chem. Soc. 113, 5135 (1991)
L. Tröger, T. Yokoyama, D. Arvanitis, T. Lederer, M. Tischer, K. Baberschke: Phys. Rev. B 49, 888 (1994)
C.S. Fadley: Progress in Surf. Sci. 16, 275 (1984)
J.J. Barton, S.W. Rohey, D.A. Shirley: Phys. Rev. B 34, 778 (1986)
C.S. Fadley: Phys. Scr. T 17, 39 (1987)
C.S. Fadley: In Synchrotron Radiation Research: Advances in Surface Science, ed. by R.C. Bachrach ( Plenum, New York 1989 )
W.F. Egelhoff, Jr.: Crit. Rev. Solid State Mat. Sci. 16, 213 (1990); Solid State Materials Sciences 16, 213 (1990)
L. Fonda: Phys. Stat. Sol. (b) 182, 9 (1994)
S.A. Chambers: In Advances in Physics ed. by S. Doniach ( Taylor and Francis, London 1991 )
W.L. Schaich: Phys. Rev. B8, 4028 (1973)
B. Lengeler: In Elektronenspektroskopische Methoden an Festkörpern und Oberflächen Vols.I and II (Kernforschungsanlage, Jülich 1980)
J. Stöhr, R. Jäger, S. Brennan: Surf. Sci. 117, 503 (1982)
D.v.d.Marel, G.A. Sawatzky, R. Zeller, F.U. Hillebrecht, J.C. Fuggle: Solid State Commun. 50, 47 (1984)
W. Speier, T.M. Hayes, J.W. Allen, J.B. Boyce, J.C. Fuggle, M. Campagna: Phys. Rev. Lett. 55, 1693 (1985)
S. Anderson: Surf. Sci. 15, 231 (1969)
D.W. Jepson, P.M. Marcus, F. Jona: Phys. Rev. B5, 3933 (1972)
Y. Jugnet, G. Grenet, N.S. Prakash, Tran Minh Due, H.C. Poon: Phys. Rev. B 38, 5281 (1988)
M.L. Xu, J.J. Barton, M.A. van Hove: Phys. Rev. B39, 8275 (1989)
W.F. Egelhoff, Jr.: Phys. Rev. Lett. 59, 559 (1987)
J. Osterwalder, T. Greber, S. Hüfner, L. Schlapbach: Phys. Rev. B 41, 12495 (1990)
S. Hüfner, J. Osterwalder, T. Greber, L. Schlapbach: Phys. Rev. B 42, 7350 (1990)
J. Osterwalder, A. Stuck, Th. Greber, L. Schlapbach, S. Hüfner: Unpublished (Université de Fribourg)
R.S. Saiki, G.S. Herman, M. Jamada, J. Osterwalder, C.S. Fadley: Phys. Rev. Lett. 63, 283 (1989)
K.U. Weiss, R. Dippel, K.M. Schindler, P. Gardner, V. Fritzsche, A.M. Bradshaw, A.L.D. Kilcoyne, D.P. Woodruff: Phys. Rev. Lett. 69, 3196 (1992)
A. Santoni, L.J. Terminello, F.J. Himpsel, T. Takahashi: Applied Physics A 52, 299 (1991)
J. Osterwalder, A. Stuck, T. Greber, P. Aebi, L. Schlapbach, S. Hüfner: Proc. 10th VUV Coni., ed. by F.J. Wullenmier, Y. Petroff, N. Nenner ( World Scientific, Singapore 1993 ) p. 475
P. Aebi, J. Osterwalder, R. Fasel, D. Naumovic, L. Schlapbach: Surf. Sci. 307–309, 917 (1994); the Fermi surface of Bi2Sr2CaCu2O8 has been determined by this method by P. Aebi, J. Osterwalder, P. Schwaller, L. Schlapbach, M. Shimoda, T. Mochiku, K. Kadowaki: Phys. Rev. Lett. 72, 2757 (1994)
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 1995 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Hüfner, S. (1995). Photoelectron Diffraction. In: Photoelectron Spectroscopy. Springer Series in Solid-State Sciences, vol 82. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-03150-6_11
Download citation
DOI: https://doi.org/10.1007/978-3-662-03150-6_11
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-03152-0
Online ISBN: 978-3-662-03150-6
eBook Packages: Springer Book Archive