Abstract
Terahertz time domain spectroscopy can help us to determine the complex refractive index of materials. To achieve this a theoretical model of the spectrometer has to be implemented; a usual method for refractive index determination is to fit a theoretically calculated transfer function to the experimental data. Material parameter extraction models based on transfer functions can be of varying complexity based on the requirements for accuracy and also the difficulty of factoring all experimental parameters. Here, we are going to show how algorithms based on transfer functions with different complexity can be setup. It will be described how a transfer function can be used to extract the refractive index of material and the key stages of the analysis, the fitting algorithm, and the need for phase unwrapping. Transfer functions of an increasing complexity will be shown, with and without the etalon term, using planar or converging beam.
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L. Duvillaret, F. Garet, J. Coutaz, IEEE J. Sel. Top. Quant. 2, 739–746 (1996)
L. Duvillaret, F. Garet, J. Coutaz, Appl. Opt. 38, (1999)
T. Dorney, R. Baraniuk, D. Mittleman, J. Opt. Soc. Am. A 18, 1562–1571 (2001)
L. Duvillaret, F. Garet, J. Roux, J. Coutaz, IEEE J. Sel. Top. Quant. 7, 615–623 (2001)
E.P.J. Parrott, J.A. Zeitler, L.F. Gladden, Opt. Lett. 34(23), 3722–3724 (2009)
E.P.J. Parrott, J.A. Zeitler, L.F. Gladden, S.N. Taraskin, S.R. Elliott, J. Non-Cryst. Solids 355(37–42), 1824–1827 (2009)
W. Withayachumnankul, B. Ferguson, T. Rainsford, S. Mickan, D. Abbott, Electron. Lett. 41, 14 (2005)
A. Bitzer, H. Heim, M. Walther, IEEE J. Sel. Top. Quant. 14(2), 476–481 (2008)
A. Bitzer, M. Walther, A. Kern, S. Gorenflo, H. Helm. Appl. Phys. Lett. 90(7) (2007)
M.T. Reiten, S.A. Harmon, R.A. Cheville, J. Opt. Soc. Am. B-Opt. Phys. 20(10), 2215–2225 (2003)
Z.P. Jiang, X.C. Zhang, Opt. Express 5(11), 243–248 (1999)
J.W. Bowen, G.C. Walker, S. Hadjiloucas, E. Berry, Conference Digest of the 2004 Joint 29th International Conference on Infrared and Millimeter Waves and 12th International Conference on Terahertz Electronics, vol. 842, pp. 551–552 (2004)
M.R. Stringer, M. Naftaly, N. Marakgos, R.E. Miles, E. Linfield, A.G. Davies, IRMMW-THz2005: The Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, vols. 1 and 2, 421–422, 660 (2005)
A.L. Chung, Z. Mihoubi, G.J. Daniell, A.H. Quarterman, K.G. Wilcox, H.E. Beere, D.A. Ritchie, A.C. Tropper, V. Apostolopoulos, Presented at the 2010 35th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2010)
P. Kuzel, H. Nemec, F. Kadlec, C. Kadlec, Opt. Express 18(15), 15338–15348 (2010)
J.A. Stratton, Electromagnetic Theory (McGraw-Hill, New York, 1941)
P.U. Jepsen, S.R. Keiding, Opt. Lett. 20(8), 807–809 (1995)
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Apostolopoulos, V., Daniell, G., Chung, A. (2012). Complex Refractive Index Determination Using Planar and Converging Beam Transfer Functions. In: Peiponen, KE., Zeitler, A., Kuwata-Gonokami, M. (eds) Terahertz Spectroscopy and Imaging. Springer Series in Optical Sciences, vol 171. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-29564-5_4
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DOI: https://doi.org/10.1007/978-3-642-29564-5_4
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