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Terahertz Spectroscopy: Ellipsometry and Active Polarization Control of Terahertz Waves

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Book cover Terahertz Spectroscopy and Imaging

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 171))

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Abstract

The principles and experimental methods of terahertz (THz) wave ellipsometry are described. The procedure to determine diagonal and off-diagonal components of the complex dielectric tensor for materials using THz time domain spectroscopy in transmission and oblique reflection geometries are explained. The measured optical activity in artificial chiral grating structures is also described as applications of this technique.

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Authors and Affiliations

  1. Department of Physics, University of Tokyo, Tokyo, Japan

    Makoto Kuwata-Gonokami

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  1. Makoto Kuwata-Gonokami
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Correspondence to Makoto Kuwata-Gonokami .

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Editors and Affiliations

  1. , Department of Physics and Mathematics, University of Eastern Finland, Yliopistokatu Street 7, Joensuu, 80100, Finland

    Kai-Erik Peiponen

  2. , Department of Chemical Engineering and, University of Cambridge, Pembroke Street, Cambridge, CB2 3RA, United Kingdom

    Axel Zeitler

  3. , School of Engineering, The University of Tokyo, Hongo, Bunkyo-ku 7-3-1, Tokyo, 113-8656, Japan

    Makoto Kuwata-Gonokami

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Kuwata-Gonokami, M. (2012). Terahertz Spectroscopy: Ellipsometry and Active Polarization Control of Terahertz Waves. In: Peiponen, KE., Zeitler, A., Kuwata-Gonokami, M. (eds) Terahertz Spectroscopy and Imaging. Springer Series in Optical Sciences, vol 171. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-29564-5_11

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  • DOI: https://doi.org/10.1007/978-3-642-29564-5_11

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-29563-8

  • Online ISBN: 978-3-642-29564-5

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