Abstract
We have studied the local surface potential and the voltage drop along individual VLS grown GaAs nanowires using Kelvin probe force microscopy. With the obtained information, we identify a core–shell structure in GaAs/GaP heterostructure nanowires, which we attribute to the difference in radial and vertical growth between the two semiconductor materials. In p-doped GaAs nanowires, qualitative and quantitative doping levels are estimated. Furthermore, we find a better incorporation of the zinc compared to the carbon to realize doping in partially p-doped GaAs nanowires by localizing the doping transitions and estimating the width of their depletion layers. Additionally, the p–n junction can be localized with a resolution better than 50 nm and the bias dependence of the depletion layer width can be studied.
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Acknowledgments
We gratefully acknowledge the financial support by the German Research Foundation (DFG) through the collaborative research centre SFB 445. The authors also thank F.-J. Tegude, W. Prost, I. Regolin, C. Gutsche, and A. Lysov from the Institute of Solid-State Electronics of the University Duisburg-Essen, for the preparation of the nanowires and for helpful discussions.
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Vinaji, S., Bacher, G., Mertin, W. (2012). Material and Doping Contrast in III/V Nanowires Probed by Kelvin Probe Force Microscopy. In: Lorke, A., Winterer, M., Schmechel, R., Schulz, C. (eds) Nanoparticles from the Gasphase. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-28546-2_8
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