Abstract
Scanning probe microscopy (SPM) methods such as scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) are the basic technologies for nanotechnology and also for future bottom-up processes. In Sect. 5.1, the principles of AFM such as its operating modes and the NC-AFM frequency-modulation method are fully explained. Then, in Sect. 5.2, applications of NC-AFM to semiconductors, which make clear its potential in terms of spatial resolution and function, are introduced. Next, in Sect. 5.3, applications of NC-AFM to insulators such as alkali halides, fluorides and transition-metal oxides are introduced. Lastly, in Sect. 5.4, applications of NC-AFM to molecules such as carboxylate (RCOO–) with R = H, CH3, C(CH3)3 and CF3 are introduced. Thus, NC-AFM can observe atoms and molecules on various kinds of surfaces such as semiconductors, insulators and metal oxides with atomic or molecular resolution. These sections are essential to understand the state of the art and future possibilities for NC-AFM, which is the second generation of atom/molecule technology.
Keywords
- Atomic Force Microscope
- Scanning Tunneling Microscope
- Bright Spot
- Alkali Halide
- Kelvin Probe Force Microscopy
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G. Binnig: Atomic force microscope, method for imaging surfaces with atomic resolution, US Patent 4724318 (1986).
G. Binnig, C.F. Quate, C. Gerber: Atomic force microscope, Phys. Rev. Lett. 56, 930–933 (1986).
G. Binnig, H. Rohrer, C. Gerber, E. Weibel: Surface studies by scanning tunneling microscopy, Phys. Rev. Lett. 49, 57–61 (1982).
G. Binnig, H. Rohrer: The scanning tunneling microscope, Sci. Am. 253, 50–56 (1985).
G. Binnig, H. Rohrer: In touch with atoms, Rev. Mod. Phys. 71, S320–S330 (1999).
C.J. Chen: Introduction to Scanning Tunneling Microscopy (Oxford University Press, Oxford, 1993).
H.-J. Güntherodt, R. Wiesendanger (eds.): Scanning Tunneling Microscopy I–III (Springer, Berlin, Heidelberg, 1991).
J.A. Stroscio, W.J. Kaiser (eds.): Scanning Tunneling Microscopy (Academic, Boston, 1993).
R. Wiesendanger: Scanning Probe Microscopy and Spectroscopy: Methods and Applications (Cambridge University Press, Cambridge, 1994).
S. Morita, R. Wiesendanger, E. Meyer (eds.): Noncontact Atomic Force Microscopy (Springer, Berlin, Heidelberg, 2002).
R. Garcia, R. Perez: Dynamic atomic force microscopy methods, Surf. Sci. Rep. 47, 197–301 (2002).
F.J. Giessibl: Advances in atomic force microscopy, Rev. Mod. Phys. 75, 949–983 (2003).
J. Israelachvili: Intermolecular and Surface Forces, 2nd edn. (Academic, London, 1991).
L. Olsson, N. Lin, V. Yakimov, R. Erlandsson: A method for in situ characterization of tip shape in AC-mode atomic force microscopy using electrostatic interaction, J. Appl. Phys. 84, 4060–4064 (1998).
S. Akamine, R.C. Barrett, C.F. Quate: Improved atomic force microscopy images using cantilevers with sharp tips, Appl. Phys. Lett. 57, 316–318 (1990).
T.R. Albrecht, S. Akamine, T.E. Carver, C.F. Quate: Microfabrication of cantilever styli for the atomic force microscope, J. Vac. Sci. Technol. A 8, 3386–3396 (1990).
M. Tortonese, R.C. Barrett, C. Quate: Atomic resolution with an atomic force microscope using piezoresistive detection, Appl. Phys. Lett. 62, 834–836 (1993).
O. Wolter, T. Bayer, J. Greschner: Micromachined silicon sensors for scanning force microscopy, J. Vac. Sci. Technol. 9, 1353–1357 (1991).
D. Sarid: Scanning Force Microscopy, 2nd edn. (Oxford University Press, New York, 1994).
F.J. Giessibl, B.M. Trafas: Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum, Rev. Sci. Instrum. 65, 1923–1929 (1994).
P. Güthner, U.C. Fischer, K. Dransfeld: Scanning near-field acoustic microscopy, Appl. Phys. B 48, 89–92 (1989).
K. Karrai, R.D. Grober: Piezoelectric tip–sample distance control for near field optical microscopes, Appl. Phys. Lett. 66, 1842–1844 (1995).
F.J. Giessibl: High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork, Appl. Phys. Lett. 73, 3956–3958 (1998).
F.J. Giessibl, S. Hembacher, H. Bielefeldt, J. Mannhart: Subatomic features on the silicon (111)-(7×7) surface observed by atomic force microscopy, Science 289, 422–425 (2000).
F. Giessibl, C. Gerber, G. Binnig: A low-temperature atomic force/scanning tunneling microscope for ultrahigh vacuum, J. Vac. Sci. Technol. B 9, 984–988 (1991).
F. Ohnesorge, G. Binnig: True atomic resolution by atomic force microscopy through repulsive and attractive forces, Science 260, 1451–1456 (1993).
F.J. Giessibl, G. Binnig: True atomic resolution on KBr with a low-temperature atomic force microscope in ultrahigh vacuum, Ultramicroscopy 42–44, 281–286 (1992).
S.P. Jarvis, H. Yamada, H. Tokumoto, J.B. Pethica: Direct mechanical measurement of interatomic potentials, Nature 384, 247–249 (1996).
L. Howald, R. Lüthi, E. Meyer, P. Güthner, H.-J. Güntherodt: Scanning force microscopy on the Si(111)7× 7 surface reconstruction, Z. Phys. B 93, 267–268 (1994).
L. Howald, R. Lüthi, E. Meyer, H.-J. Güntherodt: Atomic-force microscopy on the Si(111)7× 7 surface, Phys. Rev. B 51, 5484–5487 (1995).
Y. Martin, C.C. Williams, H.K. Wickramasinghe: Atomic force microscope – force mapping and profiling on a sub 100-Å scale, J. Appl. Phys. 61, 4723–4729 (1987).
T.R. Albrecht, P. Grütter, H.K. Horne, D. Rugar: Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity, J. Appl. Phys. 69, 668–673 (1991).
F.J. Giessibl: Atomic resolution of the silicon (111)-(7× 7) surface by atomic force microscopy, Science 267, 68–71 (1995).
S. Kitamura, M. Iwatsuki: Observation of silicon surfaces using ultrahigh-vacuum noncontact atomic force microscopy, Jpn. J. Appl. Phys. 35, 668–L671 (1995).
R. Erlandsson, L. Olsson, P. Mårtensson: Inequivalent atoms and imaging mechanisms in AC-mode atomic-force microscopy of Si(111)7× 7, Phys. Rev. B 54, R8309–R8312 (1996).
N. Burnham, R.J. Colton: Measuring the nanomechanical and surface forces of materials using an atomic force microscope, J. Vac. Sci. Technol. A 7, 2906–2913 (1989).
D. Tabor, R.H.S. Winterton: Direct measurement of normal and related van der Waals forces, Proc. R. Soc. Lond. A 312, 435 (1969).
F.J. Giessibl: Forces and frequency shifts in atomic resolution dynamic force microscopy, Phys. Rev. B 56, 16011–16015 (1997).
G. Binnig, H. Rohrer, C. Gerber, E. Weibel: 7 × 7 reconstruction on Si(111) resolved in real space, Phys. Rev. Lett. 50, 120–123 (1983).
H. Goldstein: Classical Mechanics (Addison Wesley, Reading, 1980).
U. Dürig: Interaction sensing in dynamic force microscopy, New J. Phys. 2, 5.1–5.12 (2000).
F.J. Giessibl: A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy, Appl. Phys. Lett. 78, 123–125 (2001).
U. Dürig, H.P. Steinauer, N. Blanc: Dynamic force microscopy by means of the phase-controlled oscillator method, J. Appl. Phys. 82, 3641–3651 (1997).
F.J. Giessibl, H. Bielefeldt, S. Hembacher, J. Mannhart: Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy, Appl. Surf. Sci. 140, 352–357 (1999).
M.A. Lantz, H.J. Hug, R. Hoffmann, P.J.A. van Schendel, P. Kappenberger, S. Martin, A. Baratoff, H.-J. Güntherodt: Quantitative measurement of short-range chemical bonding forces, Science 291, 2580–2583 (2001).
F.J. Giessibl, M. Herz, J. Mannhart: Friction traced to the single atom, Proc. Natl. Acad. Sci. USA 99, 12006–12010 (2002).
N. Nakagiri, M. Suzuki, K. Oguchi, H. Sugimura: Site discrimination of adatoms in Si(111)-7 × 7 by noncontact atomic force microscopy, Surf. Sci. Lett. 373, L329–L332 (1997).
Y. Sugawara, M. Ohta, H. Ueyama, S. Morita: Defect motion on an InP(110) surface observed with noncontact atomic force microscopy, Science 270, 1646–1648 (1995).
T. Uchihashi, Y. Sugawara, T. Tsukamoto, M. Ohta, S. Morita: Role of a covalent bonding interaction in noncontact-mode atomic-force microscopy on Si(111)7 × 7, Phys. Rev. B 56, 9834–9840 (1997).
K. Yokoyama, T. Ochi, A. Yoshimoto, Y. Sugawara, S. Morita: Atomic resolution imaging on Si(100)2 × 1 and Si(100)2 × 1-H surfaces using a non-contact atomic force microscope, Jpn. J. Appl. Phys. 39, L113–L115 (2000).
Y. Sugawara, T. Minobe, S. Orisaka, T. Uchihashi, T. Tsukamoto, S. Morita: Non-contact AFM images measured on Si(111)√3×√3-Ag and Ag(111) surfaces, Surf. Interface Anal. 27, 456–461 (1999).
K. Yokoyama, T. Ochi, Y. Sugawara, S. Morita: Atomically resolved Ag imaging on Si(111)√3× 3-Ag surface with noncontact atomic force microscope, Phys. Rev. Lett. 83, 5023–5026 (1999).
M. Bammerlin, R. Lüthi, E. Meyer, A. Baratoff, J. Lü, M. Guggisberg, C. Gerber, L. Howald, H.-J. Güntherodt: True atomic resolution on the surface of an insulator via ultrahigh vacuum dynamic force microscopy, Probe Microsc. J. 1, 3–7 (1997).
M. Bammerlin, R. Lüthi, E. Meyer, A. Baratoff, J. Lü, M. Guggisberg, C. Loppacher, C. Gerber, H.-J. Güntherodt: Dynamic SFM with true atomic resolution on alkali halide surfaces, Appl. Phys. A 66, S293–S294 (1998).
R. Hoffmann, M.A. Lantz, H.J. Hug, P.J.A. van Schendel, P. Kappenberger, S. Martin, A. Baratoff, H.-J. Güntherodt: Atomic resolution imaging and force versus distance measurements on KBr(001) using low temperature scanning force microscopy, Appl. Surf. Sci. 188, 238–244 (2002).
R. Bennewitz, A.S. Foster, L.N. Kantotovich, M. Bammerlin, C. Loppacher, S. Schär, M. Guggisberg, E. Meyer, A.L. Shluger: Atomically resolved edges and kinks of NaCl islands on Cu(111): Experiment and theory, Phys. Rev. B 62, 2074–2084 (2000).
A.I. Livshits, A.L. Shluger, A.L. Rohl, A.S. Foster: Model of noncontact scanning force microscopy on ionic surfaces, Phys. Rev. 59, 2436–2448 (1999).
R. Bennewitz, O. Pfeiffer, S. Schär, V. Barwich, E. Meyer, L.N. Kantorovich: Atomic corrugation in nc-AFM of alkali halides, Appl. Surf. Sci. 188, 232–237 (2002).
R. Bennewitz, S. Schär, E. Gnecco, O. Pfeiffer, M. Bammerlin, E. Meyer: Atomic structure of alkali halide surfaces, Appl. Phys. A 78, 837–841 (2004).
M. Gauthier, L. Kantrovich, M. Tsukada: Theory of energy dissipation into surface viblationsed, in Noncontact Atomic Force Microscopy, ed. by S. Morita, R. Wiesendanger, E. Meyer (Springer, Berlin/Heidelberg, 2002) pp. 371–394.
H.J. Hug, A. Baratoff: Measurement of dissipation induced by tip–sample interactions, in Noncontact Atomic Force Microscopy, ed. by S. Morita, R. Wiesendanger, E. Meyer (Springer, Berlin/Heidelberg, 2002) pp. 395–431.
R. Hoffmann, L.N. Kantorovich, A. Baratoff, H.J. Hug, H.-J. Güntherodt: Sublattice identification in scanning force microscopy on alkali halide surfaces, Phys. Rev. B 92, 146103–1–146103–4 (2004).
C. Barth, M. Reichling: Resolving ions and vacancies at step edges on insulating surfaces, Surf. Sci. 470, L99–L103 (2000).
R. Bennewitz, M. Reichling, E. Matthias: Force microscopy of cleaved and electron-irradiated CaF_2(111) surfaces in ultra-high vacuum, Surf. Sci. 387, 69–77 (1997).
M. Reichling, C. Barth: Scanning force imaging of atomic size defects on the CaF2(111) surface, Phys. Rev. Lett. 83, 768–771 (1999).
M. Reichling, M. Huisinga, S. Gogoll, C. Barth: Degradation of the CaF2(111) surface by air exposure, Surf. Sci. 439, 181–190 (1999).
A. Klust, T. Ohta, A.A. Bostwick, Q. Yu, F.S. Ohuchi, M.A. Olmstead: Atomically resolved imaging of a CaF bilayer on Si(111): Subsurface atoms and the image contrast in scanning force microscopy, Phys. Rev. B 69, 035405–1–035405–5 (2004).
C. Barth, A.S. Foster, M. Reichling, A.L. Shluger: Contrast formation in atomic resolution scanning force microscopy of CaF2(111): Experiment and theory, J. Phys. Condens. Matter 13, 2061–2079 (2001).
A.S. Foster, C. Barth, A.L. Shulger, M. Reichling: Unambiguous interpretation of atomically resolved force microscopy images of an insulator, Phys. Rev. Lett. 86, 2373–2376 (2001).
A.S. Foster, A.L. Rohl, A.L. Shluger: Imaging problems on insulators: What can be learnt from NC-AFM modeling on CaF2?, Appl. Phys. A 72, S31–S34 (2001).
F.J. Giessibl, M. Reichling: Investigating atomic details of the CaF2(111) surface with a qPlus sensor, Nanotechnology 16, S118–S124 (2005).
A.S. Foster, C. Barth, A.L. Shluger, R.M. Nieminen, M. Reichling: Role of tip structure and surface relaxation in atomic resolution dynamic force microscopy: CaF2(111) as a reference surface, Phys. Rev. B 66, 235417–1–235417–10 (2002).
C. Barth, M. Reichling: Imaging the atomic arrangements on the high-temperature reconstructed α-Al2O3 surface, Nature 414, 54–57 (2001).
M. Reichling, C. Barth: Atomically resolution imaging on fluorides, in Noncontact Atomic Force Microscopy, ed. by S. Morita, R. Wiesendanger, E. Meyer (Springer, Berlin/Heidelberg, 2002) pp. 109–123.
K. Fukui, H. Ohnishi, Y. Iwasawa: Atom-resolved image of the TiO2(110) surface by noncontact atomic force microscopy, Phys. Rev. Lett. 79, 4202–4205 (1997).
H. Raza, C.L. Pang, S.A. Haycock, G. Thornton: Non-contact atomic force microscopy imaging of TiO2(100) surfaces, Appl. Surf. Sci. 140, 271–275 (1999).
C.L. Pang, H. Raza, S.A. Haycock, G. Thornton: Imaging reconstructed TiO2(100) surfaces with non-contact atomic force microscopy, Appl. Surf. Sci. 157, 223–238 (2000).
M. Ashino, T. Uchihashi, K. Yokoyama, Y. Sugawara, S. Morita, M. Ishikawa: STM and atomic-resolution noncontact AFM of an oxygen-deficient TiO2(110) surface, Phys. Rev. B 61, 13955–13959 (2000).
R.E. Tanner, A. Sasahara, Y. Liang, E.I. Altmann, H. Onishi: Formic acid adsorption on anatase TiO2(001)-(1 × 4) thin films studied by NC-AFM and STM, J. Phys. Chem. B 106, 8211–8222 (2002).
A. Sasahara, T.C. Droubay, S.A. Chambers, H. Uetsuka, H. Onishi: Topography of anatase TiO2 film synthesized on LaAlO3(001), Nanotechnology 16, S18–S21 (2005).
C.L. Pang, S.A. Haycock, H. Raza, P.J. Møller, G. Thornton: Structures of the 4 × 1 and 1 × 2 reconstructions of SnO2(110), Phys. Rev. B 62, R7775–R7778 (2000).
H. Hosoi, K. Sueoka, K. Hayakawa, K. Mukasa: Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM, Appl. Surf. Sci. 157, 218–221 (2000).
W. Allers, S. Langkat, R. Wiesendanger: Dynamic low-temperature scanning force microscopy on nickel oxide (001), Appl. Phys. A 72, S27–S30 (2001).
T. Kubo, H. Nozoye: Surface Structure of SrTiO3(100)-(√5×√5)-R 26.6°, Phys. Rev. Lett. 86, 1801–1804 (2001).
K. Fukui, Y. Namai, Y. Iwasawa: Imaging of surface oxygen atoms and their defect structures on CeO2(111) by noncontact atomic force microscopy, Appl. Surf. Sci. 188, 252–256 (2002).
S. Suzuki, Y. Ohminami, T. Tsutsumi, M.M. Shoaib, M. Ichikawa, K. Asakura: The first observation of an atomic scale noncontact AFM image of MoO3(010), Chem. Lett. 32, 1098–1099 (2003).
C. Barth, C.R. Henry: Atomic resolution imaging of the (001) surface of UHV cleaved MgO by dynamic scanning force microscopy, Phys. Rev. Lett. 91, 196102–1–196102–4 (2003).
A.S. Foster, A.Y. Gal, J.M. Airaksinen, O.H. Pakarinen, Y.J. Lee, J.D. Gale, A.L. Shluger, R.M. Nieminen: Towards chemical identification in atomic-resolution noncontact AFM imaging with silicon tips, Phys. Rev. B 68, 195420–1–195420–8 (2003).
A.S. Foster, A.Y. Gal, J.D. Gale, Y.J. Lee, R.M. Nieminen, A.L. Shluger: Interaction of silicon dangling bonds with insulating surfaces, Phys. Rev. Lett. 92, 036101–1–036101–4 (2004).
T. Eguchi, Y. Hasegawa: High resolution atomic force microscopic imaging of the Si(111)-(7× 7) surface: Contribution of short-range force to the images, Phys. Rev. Lett. 89, 266105–1–266105–4 (2002).
T. Arai, M. Tomitori: A Si nanopillar grown on a Si tip by atomic force microscopy in ultrahigh vacuum for a high-quality scanning probe, Appl. Phys. Lett. 86, 073110–1–073110–3 (2005).
K. Mukasa, H. Hasegawa, Y. Tazuke, K. Sueoka, M. Sasaki, K. Hayakawa: Exchange interaction between magnetic moments of ferromagnetic sample and tip: Possibility of atomic-resolution images of exchange interactions using exchange force microscopy, Jpn. J. Appl. Phys. 33, 2692–2695 (1994).
H. Ness, F. Gautier: Theoretical study of the interaction between a magnetic nanotip and a magnetic surface, Phys. Rev. B 52, 7352–7362 (1995).
K. Nakamura, H. Hasegawa, T. Oguchi, K. Sueoka, K. Hayakawa, K. Mukasa: First-principles calculation of the exchange interaction and the exchange force between magnetic Fe films, Phys. Rev. B 56, 3218–3221 (1997).
A.S. Foster, A.L. Shluger: Spin-contrast in non-contact SFM on oxide surfaces: Theoretical modeling of NiO(001) surface, Surf. Sci. 490, 211–219 (2001).
T. Oguchi, H. Momida: Electronic structure and magnetism of antiferromagnetic oxide surface – First-principles calculations, J. Surf. Sci. Soc. Jpn. 26, 138–143 (2005).
H. Hosoi, M. Kimura, K. Sueoka, K. Hayakawa, K. Mukasa: Non-contact atomic force microscopy of an antiferromagnetic NiO(100) surface using a ferromagnetic tip, Appl. Phys. A 72, S23–S26 (2001).
H. Hölscher, S.M. Langkat, A. Schwarz, R. Wiesendanger: Measurement of three-dimensional force fields with atomic resolution using dynamic force spectroscopy, Appl. Phys. Lett. 81, 4428–4430 (2002).
S.M. Langkat, H. Hölscher, A. Schwarz, R. Wiesendanger: Determination of site specific interaction forces between an iron coated tip and the NiO(001) surface by force field spectroscopy, Surf. Sci. 527, 12–20 (2003).
R. Hoffmann, M.A. Lantz, H.J. Hug, P.J.A. van Schendel, P. Kappenberger, S. Martin, A. Baratoff, H.-J. Güntherodt: Atomic resolution imaging and frequency versus distance measurement on NiO(001) using low-temperature scanning force microscopy, Phys. Rev. B 67, 085402–1–085402–6 (2003).
H. Hosoi, K. Sueoka, K. Hayakawa, K. Mukasa: Atomically resolved imaging of a NiO(001) surface, in Noncontact Atomic Force Microscopy, ed. by S. Morita, R. Wiesendanger, E. Meyer (Springer, Berlin/Heidelberg, 2002) pp. 125–134.
K. Sueoka, A. Subagyo, H. Hosoi, K. Mukasa: Magnetic imaging with scanning force microscopy, Nanotechnology 15, S691–S698 (2004).
H. Hosoi, K. Sueoka, K. Mukasa: Investigations on the topographic asymmetry of non-contact atomic force microscopy images of NiO(001) surface observed with a ferromagnetic tip, Nanotechnology 15, 505–509 (2004).
H. Momida, T. Oguchi: First-principles studies of antiferromagnetic MnO and NiO surfaces, J. Phys. Soc. Jpn. 72, 588–593 (2003).
K. Kobayashi, H. Yamada, T. Horiuchi, K. Matsushige: Structures and electrical properties of fullerene thin films on Si(111)-7 × 7 surface investigated by noncontact atomic force microscopy, Jpn. J. Appl. Phys. 39, 3821–3829 (2000).
R.M. Overney, E. Meyer, J. Frommer, D. Brodbeck, R. Lüthi, L. Howald, H.-J. Güntherodt, M. Fujihira, H. Takano, Y. Gotoh: Friction measurements on phase-separated thin films with amodified atomic force microscope, Nature 359, 133–135 (1992).
D. Frisbie, L.F. Rozsnyai, A. Noy, M.S. Wrighton, C.M. Lieber: Functional group imaging by chemical force microscopy, Science 265, 2071–2074 (1994).
E. Meyer, L. Howald, R.M. Overney, H. Heinzelmann, J. Frommer, H.-J. Güntherodt, T. Wagner, H. Schier, S. Roth: Molecular-resolution images of Langmuir–Blodgett films using atomic force microscopy, Nature 349, 398–400 (1992).
K. Fukui, H. Onishi, Y. Iwasawa: Imaging of individual formate ions adsorbed on TiO2(110) surface by non-contact atomic force microscopy, Chem. Phys. Lett. 280, 296–301 (1997).
K. Kobayashi, H. Yamada, T. Horiuchi, K. Matsushige: Investigations of C60 molecules deposited on Si(111) by noncontact atomic force microscopy, Appl. Surf. Sci. 140, 281–286 (1999).
T. Uchihashi, M. Tanigawa, M. Ashino, Y. Sugawara, K. Yokoyama, S. Morita, M. Ishikawa: Identification of B-form DNA in an ultrahigh vacuum by noncontact-mode atomic force microscopy, Langmuir 16, 1349–1353 (2000).
Y. Maeda, T. Matsumoto, T. Kawai: Observation of single- and double-strand DNA using non-contact atomic force microscopy, Appl. Surf. Sci. 140, 400–405 (1999).
T. Uchihashi, T. Ishida, M. Komiyama, M. Ashino, Y. Sugawara, W. Mizutani, K. Yokoyama, S. Morita, H. Tokumoto, M. Ishikawa: High-resolution imaging of organic monolayers using noncontact AFM, Appl. Surf. Sci. 157, 244–250 (2000).
T. Fukuma, K. Kobayashi, T. Horiuchi, H. Yamada, K. Matsushige: Alkanethiol self-assembled monolayers on Au(111) surfaces investigated by non-contact AFM, Appl. Phys. A 72, S109–S112 (2001).
B. Gotsmann, C. Schmidt, C. Seidel, H. Fuchs: Molecular resolution of an organic monolayer by dynamic AFM, Eur. Phys. J. B 4, 267–268 (1998).
C. Loppacher, M. Bammerlin, M. Guggisberg, E. Meyer, H.-J. Güntherodt, R. Lüthi, R. Schlittler, J.K. Gimzewski: Forces with submolecular resolution between the probing tip and Cu-TBPP molecules on Cu(100) observed with a combined AFM/STM, Appl. Phys. A 72, S105–S108 (2001).
L.M. Eng, M. Bammerlin, C. Loppacher, M. Guggisberg, R. Bennewitz, R. Lüthi, E. Meyer, H.-J. Güntherodt: Surface morphology, chemical contrast, and ferroelectric domains in TGS bulk single crystals differentiated with UHV non-contact force microscopy, Appl. Surf. Sci. 140, 253–258 (1999).
S. Kitamura, K. Suzuki, M. Iwatsuki: High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope technique, Appl. Surf. Sci. 140, 265–270 (1999).
H. Yamada, T. Fukuma, K. Umeda, K. Kobayashi, K. Matsushige: Local structures and electrical properties of organic molecular films investigated by non-contact atomic force microscopy, Appl. Surf. Sci. 188, 391–398 (2000).
K. Fukui, Y. Iwasawa: Fluctuation of acetate ions in the (2 × 1)-acetate overlayer on TiO2(110)-(1 × 1) observed by noncontact atomic force microscopy, Surf. Sci. 464, L719–L726 (2000).
A. Sasahara, H. Uetsuka, H. Onishi: Singlemolecule analysis by non-contact atomic force microscopy, J. Phys. Chem. B 105, 1–4 (2001).
A. Sasahara, H. Uetsuka, H. Onishi: NC-AFM topography of HCOO and CH3COO molecules co-adsorbed on TiO2(110), Appl. Phys. A 72, S101–S103 (2001).
A. Sasahara, H. Uetsuka, H. Onishi: Image topography of alkyl-substituted carboxylates observed by noncontact atomic force microscopy, Surf. Sci. 481, L437–L442 (2001).
A. Sasahara, H. Uetsuka, H. Onishi: Noncontact atomic force microscope topography dependent on permanent dipole of individual molecules, Phys. Rev. B 64, 121406 (2001).
A. Sasahara, H. Uetsuka, T. Ishibashi, H. Onishi: A needle-like organic molecule imaged by noncontact atomic force microscopy, Appl. Surf. Sci. 188, 265–271 (2002).
H. Onishi, A. Sasahara, H. Uetsuka, T. Ishibashi: Molecule-dependent topography determined by noncontact atomic force microscopy: Carboxylates on TiO2(110), Appl. Surf. Sci. 188, 257–264 (2002).
H. Onishi: Carboxylates adsorbed on TiO2(110), in Chemistry of Nano-molecular Systems, ed. by T. Nakamura (Springer, Berlin/Heidelberg, 2002) pp. 75–89.
S. Thevuthasan, G.S. Herman, Y.J. Kim, S.A. Chambers, C.H.F. Peden, Z. Wang, R.X. Ynzunza, E.D. Tober, J. Morais, C.S. Fadley: The structure of formate on TiO2(110) by scanned-energy and scanned-angle photoelectron diffraction, Surf. Sci. 401, 261–268 (1998).
H. Uetsuka, A. Sasahara, A. Yamakata, H. Onishi: Microscopic identification of a bimolecular reaction intermediate, J. Phys. Chem. B 106, 11549–11552 (2002).
D.R. Lide: Handbook of Chemistry and Physics, 81st edn. (CRC, Boca Raton, 2000).
K. Kobayashi, H. Yamada, K. Matsushige: Dynamic force microscopy using FM detection in various environments, Appl. Surf. Sci. 188, 430–434 (2002).
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Giessibl, F.J. et al. (2011). Noncontact Atomic Force Microscopy and Related Topics. In: Bhushan, B. (eds) Nanotribology and Nanomechanics I. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-15283-2_5
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