Abstract
Reliability is expected to be a critical challenge in designing future molecular electronic circuits. Using a compact model that captures the essential physics of the device, the effect on digital gate functionality of variations in the device parameters, as well as the improvements afforded by a TMR majority gate structure are quantified. It is shown that the improvement is substantial, showing the potential viability of such technologies in future massively integrated systems.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
Chen, J., Reed, M.A., Rawlett, A., Tour, J.: Large on-off ratios and negative differential resistance in a molecular electronic device. Science 286, 1550–1552 (1999)
Collier, C.P., et al: Electronically configurable molecular-based logic gates. Science 285, 391–394 (1999)
Lei, C., Pamunuwa, D., Bailey, S., Lambert, C.: Application of molecular electronics devices in digital circuit design. In: Social Informatics and Telecommunications Engineering (Proc. Nano-Net), Boston, Massachusetts, USA. LNCS. Springer, Heidelberg (2008)
Nikolic, K., Sadek, A., Forshaw, M.: Fault-tolerant techniques for nanocomputers. Nanotechnology 13, 357–362 (2002)
Sadek, A.S., Nikolic, K., Forshaw, M.: Parallel information and computation with restitution for noise-tolerant nanoscale logic networks. Nanotechnology 15, 192–210 (2004)
Lei, C., Pamunuwa, D., Bailey, S., Lambert, C.: Molecular electronics device modeling for system design. In: IEEE Conf. Nanotechnology (IEEE-NANO), Hong Kong (2007)
Chen, Y., et al: Nanoscale molecular-switch crossbar circuits. Nanotechnology 14, 462–468 (2003)
Lei, C., Pamunuwa, D., Bailey, S., Lambert, C.: Design of robust molecular electronic circuits. In: International Symposium on Circuits and Systems (ISCAS), Taiwan. IEEE, Los Alamitos (2009)
Landauer, R.: Can a length of perfect conductor have a resistance. Phys. Lett. 85A, 91–93 (1981)
Lambert, C.: Localization with phase correlations and the effect of periodic cycles. J. Phys. C17, 2401 (1984)
Lambert, C.: Anomalies In The Transport Properties Of A Disordered Solid. Phys. Rev. B 29, 1091 (1984)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2009 ICST Institute for Computer Science, Social Informatics and Telecommunications Engineering
About this paper
Cite this paper
Lei, C., Pamunuwa, D., Bailey, S., Lambert, C. (2009). Designing Reliable Digital Molecular Electronic Circuits. In: Schmid, A., Goel, S., Wang, W., Beiu, V., Carrara, S. (eds) Nano-Net. NanoNet 2009. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, vol 20. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-04850-0_17
Download citation
DOI: https://doi.org/10.1007/978-3-642-04850-0_17
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-04849-4
Online ISBN: 978-3-642-04850-0
eBook Packages: Computer ScienceComputer Science (R0)