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Microstructure, Property and Processing of Functional Ceramics pp 229–282Cite as

Piezoresponse Force Microscopy of Functional Ceramics

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Abstract

Piezoresponse force microscopy (PFM) was customer-built based on the commercial atomic force microscope and used to characterize ferroelectric domains of functional materials. The PFM imaging contrast mechanism, domain configuration and their evolution behavior under the inhomogeneous tip fields in ferroelectric thin film, lead-free piezoelectric ceramics and relaxor-type single crystals are presented in details in this chapter.

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© 2009 Metallurgical Industry Press, Beijing and Springer-Verlag GmbH Berlin Heidelberg

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(2009). Piezoresponse Force Microscopy of Functional Ceramics. In: Microstructure, Property and Processing of Functional Ceramics. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-01694-3_4

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