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International Symposium on Automated Technology for Verification and Analysis

ATVA 2008: Automated Technology for Verification and Analysis pp 201–215Cite as

Controllable Test Cases for the Distributed Test Architecture

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Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 5311))

Abstract

In the distributed test architecture, a system with multiple ports is tested using a tester at each port/interface, these testers cannot communicate with one another and there is no global clock. Recent work has defined an implementation relation for testing against an input-output transition system in the distributed test architecture. However, this framework placed no restrictions on the test cases and, in particular, allowed them to produce some kind of nondeterminism. In addition, it did not consider the test generation problem. This paper explores the class of controllable test cases for the distributed test architecture, defining a new implementation relation and a test generation algorithm.

Research partially supported by the Spanish MEC project WEST/FAST (TIN2006-15578-C02-01) and the Marie Curie project MRTN-CT-2003-505121/TAROT.

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Author information

Authors and Affiliations

  1. Department of Information Systems and Computing, Brunel University, Uxbridge, Middlesex, UB8 3PH, United Kingdom

    Robert M. Hierons & Mercedes G. Merayo

  2. Departamento de Sistemas Informáticos y Computación, Universidad Complutense de Madrid, Madrid, Spain

    Mercedes G. Merayo & Manuel Núñez

Authors
  1. Robert M. Hierons
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  2. Mercedes G. Merayo
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  3. Manuel Núñez
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Editor information

Editors and Affiliations

  1. College of Information & Communication, Division of Computer and Communication Engineering, Korea University, Anam-Dong, Seongbuk-Gu, 136-701, Seoul, South Korea

    Sungdeok (Steve) Cha

  2. Departmnet of Computer Science and Engineering, Korea University, Anam-Dong, Seongbuk-Gu, 136-702, Seoul, South Korea

    Jin-Young Choi

  3. KAIST, Department of Computer Science, Guseong-Dong, Yuseong-Gu, 305-701, Daejon, South Korea

    Moonzoo Kim

  4. School of Engineering and Applied Science, Department of Computer and Information Science,, University of Pennsylvania, Levine Hall, Room 602, 3330 Walnut Street, PA 19104-6389, Philadelphia, USA

    Insup Lee

  5. Thomas M. Siebel Center , University of Illinois at Urbana-Champaign, 201 N. Goodwin Avenue, IL 61801-2302, Urbana, USA

    Mahesh Viswanathan

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© 2008 Springer-Verlag Berlin Heidelberg

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Hierons, R.M., Merayo, M.G., Núñez, M. (2008). Controllable Test Cases for the Distributed Test Architecture. In: Cha, S.(., Choi, JY., Kim, M., Lee, I., Viswanathan, M. (eds) Automated Technology for Verification and Analysis. ATVA 2008. Lecture Notes in Computer Science, vol 5311. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-88387-6_16

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  • DOI: https://doi.org/10.1007/978-3-540-88387-6_16

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-88386-9

  • Online ISBN: 978-3-540-88387-6

  • eBook Packages: Computer ScienceComputer Science (R0)

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