Abstract
One methodology for evaluating the matching performance of biometric authentication systems is the detection error tradeoff (DET) curve. The DET curve graphically illustrates the relationship between false rejects and false accepts when varying a threshold across a genuine and an imposter match score distributions. This paper makes two contributions to the literature on the matching performance evaluation of biometric identification or bioauthentication systems. First, we create curvewise DET confidence regions using radial sweep methods. Second we use this same methodology to create pointwise confidence intervals for the equal error rate (EER). The EER is the rate at which the false accept rate and the false reject rate are identical. We utilize resampling or bootstrap methods to estimate the variability in both the DET and the EER. Our radial sweep is based on converting the false reject and false accept errors to polar coordinates. Application is made of these methods to data from three different biometric modalities and we discuss the results of these applications.
Download to read the full chapter text
Chapter PDF
Similar content being viewed by others
References
Mansfield, T., Wayman, J.L.: Best practices in testing and reporting performance of biometric devices (2002), on the web at www.cesg.gov.uk/site/ast/biometrics/media/BestPractice.pdf
Green, D.M., Swets, J.A.: Signal Detection Theory and Psychophysics. John Wiley & Sons, Chichester (1966)
Poh, N., Bengio, S.: Database, protocol and tools for evaluating score-level fusion algorithms in biometric authentication. Pattern Recognition Journal (2005)
Zhou, X.-H., McClish, D.K., Obuchowski, N.A.: Statistical Methods in Diagnostic Medicine. John Wiley & Sons, Chichester (2002)
Hernández-Orallo, J., Ferri, C., Lachiche, N., Flach, P.A. (eds.): ROC Analysis in Artificial Intelligence, 1st Int. Workshop, ROCAI-2004, Valencia, Spain (2004)
Macskassy, S.A., Provost, F.J., Rosset, S.: Roc confidence bands: an empirical evaluation. In: De Raedt, L., Wrobel, S. (eds.) ICML, pp. 537–544. ACM, New York (2005)
Campbell, G.: Advance in statistical methodology for the evaluation of diagnostic and laboratory tests. Statistics in Medicine 13, 499–508 (1994)
Ma, G., Hall, W.J.: Confidence bands for receiver operating characteristics curves. Medical Decision Making 13, 191–197 (1993)
Poh, N., Martin, A., Bengio, S.: Performance generalization in biometric authentication using joint user-specific and sample bootstraps. IEEE Transactions on Pattern Analysis and Machine Intelligence (to appear)
Adler, A., Schuckers, M.E.: Calculation of a composite DET curve. In: Kanade, T., Jain, A., Ratha, N.K. (eds.) AVBPA 2005. LNCS, vol. 3546, pp. 279–288. Springer, Heidelberg (2005)
Dass, S.C., Zhu, Y., Jain, A.K.: Validating a biometric authentication system: Sample size requirements. IEEE Transactions on Pattern Analysis and Machine Intelligence 28(1), 19–30 (2007)
Ross, A., Jain, A.K.: Information fusion in biometrics. Pattern Recognition Letters 24(13), 2115–2125 (2003)
Bolle, R.M., Ratha, N.K., Pankanti, S.: Error analysis of pattern recognition systems – the subsets bootstrap. Computer Vision and Image Understanding 93, 1–33 (2004)
Agresti, A., Coull, B.A.: Approximate is better than ”exact” for interval estimation of binomial proportions. The American Statistician 52(2), 119–126 (1998)
Author information
Authors and Affiliations
Editor information
Rights and permissions
Copyright information
© 2007 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Schuckers, M.E., Minev, Y., Adler, A. (2007). Curvewise DET Confidence Regions and Pointwise EER Confidence Intervals Using Radial Sweep Methodology. In: Lee, SW., Li, S.Z. (eds) Advances in Biometrics. ICB 2007. Lecture Notes in Computer Science, vol 4642. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-74549-5_40
Download citation
DOI: https://doi.org/10.1007/978-3-540-74549-5_40
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-74548-8
Online ISBN: 978-3-540-74549-5
eBook Packages: Computer ScienceComputer Science (R0)