Abstract
This chapter explains the origin of features observed in TEM images of crystalline materials. These microstructural features, having sizes from nanometers to microns, control many important properties of materials. TEM often provides information about these microstructural features with greater detail and clarity than any other experimental technique. There are subtleties, however, in the interpretation of images such as those from the dislocation segments running from top to bottom of the sample in the figure above. The dislocations themselves do not have the modulations in width seen in the image, and the dislocation images are displaced horizontally from the actual positions of the cores of the dislocations. By changing the tilt of the incident beam on the Bragg planes of the crystal, i.e., changing the “diffraction condition,” the images of the dislocations can shift in position, split in two, or disappear entirely.
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Further Reading
M. De Graef: Introduction to Conventional Transmission Electron Microscopy (University Press, Cambridge 2003).
J.W. Edington: Practical Electron Microscopy in Materials Science, 3. Interpretation of Transmission Electron Micrographs (Philips Technical Library, Eindhoven 1975).
J. W. Edington: Practical Electron Microscopy in Materials Science, 4. Typical Electron Microscope Investigations (Philips Technical Library, Eindhoven 1976).
C. T. Forwood and L. M. Clarebrough: Electron Microscopy of Interfaces in Metals and Alloys (Adam Hilger IOP Publishing Ltd., Bristol 1991).
A. K. Head, P. Humble, L. M. Clarebrough, A. J. Morton and C. T. Forwood: Computed Electron Micrographs and Defect Identification (North-Holland Publishing Company, Amsterdam 1973).
P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan: Electron Microscopy of Thin Crystals (R. E. Krieger, Malabar, Florida 1977).
L. Reimer: Transmission Electron Microscopy: Physics of Image Formation and Microanalysis 4th Ed. (Springer-Verlag, New York 1997).
G. Thomas and M. J. Goringe: Transmission Electron Microscopy of Materials (Wiley-Interscience, New York 1979).
D. B. Williams and C. B. Carter: Transmission Electron Microscopy: A Textbook for Materials Science (Plenum Press, New York 1996).
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© 2008 Springer-Verlag Berlin Heidelberg
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(2008). Diffraction Contrast in TEM Images. In: Transmission Electron Microscopy and Diffractometry of Materials. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-73886-2_7
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DOI: https://doi.org/10.1007/978-3-540-73886-2_7
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-73885-5
Online ISBN: 978-3-540-73886-2
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