Abstract
Materials are made of atoms. Knowledge of how atoms are arranged into crystal structures and microstructures is the foundation on which we build our understanding of the synthesis, structure and properties of materials. There are many techniques for measuring chemical compositions of materials, and methods based on inner-shell electron spectroscopies are covered in this book. The larger emphasis of the book is on measuring spatial arrangements of atoms in the range from 10−8 to 10−4 cm, bridging from the unit cell of the crystal to the microstructure of the material. There are many different methods for for measuring structure across this wide range of distances, but the more powerful experimental techniques involve diffraction. To date, most of our knowledge about the spatial arrangements of atoms in materials has been gained from diffraction experiments. In a diffraction experiment, an incident wave is directed into a material and a detector is typically moved about to record the directions and intensities of the outgoing diffracted waves.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Further Reading
Leonid V. Azároff: Elements of X-Ray Crystallography, (McGraw-Hill, New York 1968), reprinted by TechBooks, Fairfax, VA.
Bernard D. Cullity: Elements of X-Ray Diffraction, (Addison-Wesley, Reading, MA 1978).
International Tables for X-ray Crystallography, (Kynock Press, Birmingham, England, 1952-).
Harold P. Klug and Leroy E. Alexander: X-Ray Diffraction Procedures, (Wiley-Interscience, New York 1974).
L. H. Schwartz and J. B. Cohen: Diffraction from Materials, (Springer-Verlag, Berlin 1987).
B. E. Warren: X-Ray Diffraction (Dover, Mineola, New York 1990).
M. F. C. Ladd and R. A. Palmer: Structure Determination by X-ray Crystallography (Plenum Press, New York, NY 1993), and George H. Stout and Lyle H. Jensen: X-ray Structure Determination: A Practical Guide (Wiley-Interscience, New York, NY 1989).
Rights and permissions
Copyright information
© 2008 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
(2008). Diffraction and the X-Ray Powder Diffractometer. In: Transmission Electron Microscopy and Diffractometry of Materials. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-73886-2_1
Download citation
DOI: https://doi.org/10.1007/978-3-540-73886-2_1
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-73885-5
Online ISBN: 978-3-540-73886-2
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)