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Applied Scanning Probe Methods V pp 269–286Cite as

New AFM Developments to Study Elasticity and Adhesion at the Nanoscale

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Authors and Affiliations

  1. School of Physics, Georgia Institute of Technology, 837 State Street, Atlanta, GA, 30332-0430, USA

    Robert Szoszkiewicz & Elisa Riedo

Authors
  1. Robert Szoszkiewicz
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  2. Elisa Riedo
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Editors and Affiliations

  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W390 Scott Laboratory, The Ohio State University, 201W. 19th Avenue, Columbus, Ohio, 43210-1142, USA

    Bharat Bhushan

  2. Department of Mathematics, Osaka City University, Graduate School of Science, Sugimoto 3-3-138, 558-8585, Osaka, Japan

    Satoshi Kawata

  3. Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Gievenbecker Weg 11, 48149, Münster, Germany

    Harald Fuchs

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Szoszkiewicz, R., Riedo, E. (2007). New AFM Developments to Study Elasticity and Adhesion at the Nanoscale. In: Bhushan, B., Kawata, S., Fuchs, H. (eds) Applied Scanning Probe Methods V. NanoScience and Technology. Springer, Berlin, Heidelberg . https://doi.org/10.1007/978-3-540-37316-2_9

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