RF Measurement Basics
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Proper characterisation of RF circuits is an important step within the design process. The measurements verify if the simulations hold and the IC hardware has been fabricated without significant process variations. Equipment with performances beyond that of the DUT (Device Under Test) is required making the measurement of high-speed circuits challenging and expensive. Today’s commercial equipment allows measurements at frequencies of up to 100 GHz. The costs for the basic equipment in an RF measurement laboratory may easily exceed 500 k€. In this section, we will review the key measurement techniques and components. Detailed discussions can be found in the specific literature [Bai85, Bry88, Sch99].
- Agilent tutorial notes, fundamentals of RF and microwave noise figure measurements, application note 57-1, 2005.
- Agilent tutorial notes, Noise figure measurement accuracy — the Y-factor method, application note 57-2, 2005.
- Bailey, A. E. (1985) Microwave Measurements. Peter Peregrinus Ltd., London
- Bryant, G. H. (1988) Principles of Microwave Measurements. Peter Peregrinus Ltd., London
- S. Goldman, “Analyze effects of system delay lines”, Microwave & RF, pp.149–156, June 1987.
- G. Payne, Practical considerations for modern RF & microwave phase noise measurements, Agilent applications note, 2005.
- B. Schiek, Grundlagen der Hochfrequenz Messtechnik, Springer, 1999.
- I. Yuval, “Proper delay line discriminator design avoids common pitfalls”, Microwave System News, pp. 109–114, Dec. 1981.
- RF Measurement Basics
- Book Title
- Radio Frequency Integrated Circuits and Technologies
- pp 481-498
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- Springer Berlin Heidelberg
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- Springer-Verlag Berlin Heidelberg
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