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Advanced Mechatronics Solutions pp 341–346Cite as

Methods for verifying the dimensional and material properties on industrial CT scanners according to VDI / VDE 2630 Blatt 1.3.

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Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 393))

Abstract

In the article methods for verifying the dimensional and material properties like GS, GF i GG on industrial CT scanners according to VDI/VDE 2630 Blatt 1.3. “Computertomografie in der dimensionellen Messtechnik” guidelines were described. The proposed gauges in the form of a stepped cylinder were presented. In studies two types of different materials of gauges with different X-ray absorption coefficients were used. The study on METROTOM CT 800 manufactured by C. Zeiss with the X-ray tube voltage of 130 kV was performed. As the material for the gauges aluminum (aluminum alloy PA6) and ertacetal was selected. Both gauges in an accredited laboratory were calibrated.

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References

  1. De Chiffre, L., Carmignato, S., Kruth, J.P., Schmitt, R., Weckenmann, A.: Industrial applications of computed tomography. CIRP Annals - Manufacturing Technology. 63 (2014) 655–677

    Google Scholar 

  2. Kruth, J.P., Bartscher, M., Carmignato, S., Schmitt, R., De Chiffre, L., Weckenmann A.: Computed tomography for dimensional metrology. CIRP Annals - Manufacturing Technology. 60 (2011), pp. 821–842

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  3. Müller P., Hiller J., Cantatore A., Tosello G., De Chiffre L.: „New reference object for metrological performance testing of industrial CT systems”. Departement of Mechanical Engineering, Technical University of Denmark (DTU), Kgs. Lyngby (Dania), 2012

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  4. Ryniewicz A.: „Accuracy assessment of shape mapping using Computer Tomography”. Metrology and Measuring Systems. Quarterly of Polish Academy of Sciences. Vol.XVII, No.3/2010.482-491

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  5. VDI/VDE 2617 Blatt 13: Accuracy of coordinate measuring machines - Characteristics and their testing - Guideline for the application of DIN EN ISO 10360 for coordinate measuring machines with CT-sensors.

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Acknowledgements

The research described in the article have been financed with funds from the National Research and Development Centre. Grant NCBiR no. PBS2/B6/16/2013.

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Authors and Affiliations

  1. Faculty of Mechatronics, Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, Warsaw, Poland

    Tomasz Kowaluk & Adam Woźniak

Authors
  1. Tomasz Kowaluk
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  2. Adam Woźniak
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Corresponding author

Correspondence to Tomasz Kowaluk .

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Editors and Affiliations

  1. Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, Warsaw, Poland

    Ryszard Jabłoński

  2. Institute of Automation and Computer Science, Brno University of Technology, Brno, Czech Republic

    Tomas Brezina

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Kowaluk, T., Woźniak, A. (2016). Methods for verifying the dimensional and material properties on industrial CT scanners according to VDI / VDE 2630 Blatt 1.3.. In: Jabłoński, R., Brezina, T. (eds) Advanced Mechatronics Solutions. Advances in Intelligent Systems and Computing, vol 393. Springer, Cham. https://doi.org/10.1007/978-3-319-23923-1_52

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  • DOI: https://doi.org/10.1007/978-3-319-23923-1_52

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-23921-7

  • Online ISBN: 978-3-319-23923-1

  • eBook Packages: EngineeringEngineering (R0)

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