Sensitivity and Offset Voltage Testing in the Hall-Effect Sensors Made of Graphene

  • Oleg Petruk
  • Roman Szewczyk
  • Tymoteusz Ciuk
  • Włodzimierz Strupiński
  • Jacek Salach
  • Michał Nowicki
  • Iwona Pasternak
  • Wojciech Winiarski
  • Krzysztof Trzcinka
Conference paper

DOI: 10.1007/978-3-319-05353-0_60

Volume 267 of the book series Advances in Intelligent Systems and Computing (AISC)
Cite this paper as:
Petruk O. et al. (2014) Sensitivity and Offset Voltage Testing in the Hall-Effect Sensors Made of Graphene. In: Szewczyk R., Zieliński C., Kaliczyńska M. (eds) Recent Advances in Automation, Robotics and Measuring Techniques. Advances in Intelligent Systems and Computing, vol 267. Springer, Cham

Abstract

Paper presents the results of the hall effect testing in the graphene structures. Special hall effect structures were designed and build, using large graphene sheets. Laboratory testing stand was developed to test sensitivity and offset voltage in hall effect structures under external magnetic field. Characteristics of investigated structures were measured, including such impacting factors as structure size, external magnetic field strength, temperature and time.

Keywords

Hall effect graphene magnetic sensor 

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Copyright information

© Springer International Publishing Switzerland 2014

Authors and Affiliations

  • Oleg Petruk
    • 1
  • Roman Szewczyk
    • 2
  • Tymoteusz Ciuk
    • 3
  • Włodzimierz Strupiński
    • 3
  • Jacek Salach
    • 2
  • Michał Nowicki
    • 2
  • Iwona Pasternak
    • 3
  • Wojciech Winiarski
    • 1
  • Krzysztof Trzcinka
    • 1
  1. 1.Industrial Research Institute for Automation and Measurements PIAPWarsawPoland
  2. 2.Institute of Metrology and Biomedical EngineeringWarsaw University of TechnologyWarsawPoland
  3. 3.Institute of Electronic Materials TechnologyWarsawPoland