Chapter

Recent Advances in Automation, Robotics and Measuring Techniques

Volume 267 of the series Advances in Intelligent Systems and Computing pp 631-640

Sensitivity and Offset Voltage Testing in the Hall-Effect Sensors Made of Graphene

  • Oleg PetrukAffiliated withIndustrial Research Institute for Automation and Measurements PIAP Email author 
  • , Roman SzewczykAffiliated withInstitute of Metrology and Biomedical Engineering, Warsaw University of Technology
  • , Tymoteusz CiukAffiliated withInstitute of Electronic Materials Technology
  • , Włodzimierz StrupińskiAffiliated withInstitute of Electronic Materials Technology
  • , Jacek SalachAffiliated withInstitute of Metrology and Biomedical Engineering, Warsaw University of Technology
  • , Michał NowickiAffiliated withInstitute of Metrology and Biomedical Engineering, Warsaw University of Technology
  • , Iwona PasternakAffiliated withInstitute of Electronic Materials Technology
  • , Wojciech WiniarskiAffiliated withIndustrial Research Institute for Automation and Measurements PIAP
  • , Krzysztof TrzcinkaAffiliated withIndustrial Research Institute for Automation and Measurements PIAP

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Abstract

Paper presents the results of the hall effect testing in the graphene structures. Special hall effect structures were designed and build, using large graphene sheets. Laboratory testing stand was developed to test sensitivity and offset voltage in hall effect structures under external magnetic field. Characteristics of investigated structures were measured, including such impacting factors as structure size, external magnetic field strength, temperature and time.

Keywords

Hall effect graphene magnetic sensor