Abstract
In this chapter we demonstrate the growth and characterization of nonpolar relaxed cubic GaN by plasma-assisted molecular beam epitaxy on prepatterned 3C-SiC/Si (001) substrates. Nanopatterning of 3C-SiC/Si (001) was achieved by two different fabrication techniques: nanosphere lithography (NSL) to generate large-area pattern, and conventional electron beam lithography (EBL) for tailoring particular surface morphologies. Both methods were followed by a lift-off and a reactive ion etching (RIE) process. We analyze the influence of the substrate on the GaN growth and show that it is possible to grow single phase and defect-reduced cubic GaN crystals on 3C-SiC nanostructures. Furthermore cubic GaN/AlN multiquantum wells were grown on 3C-SiC nanostructures, which is a further step toward nanoscaled device applications.
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References
Nakamura, S., Mukai, I., Senok, M.: Candelaclass highbrightness InGaN/AlGaN doubleheterostructure bluelight emitting diodes. Appl. Phys. Lett. 64, 1687 (1994)
Rajan, S., Waltereit, P., Poblenz, C., Heikman, S.J., Green, D.S., Speck, J.S., Mishra, U.K.: Power Performance of AlGaN-GaN HEMTs Grown on SiC by Plasma-Assisted MBE. IEEE Electron Device Lett. 25, 247 (2004)
Tschumak, E., Granzer, R., Lindner, J.K.N., Schweiz, F., Lischka, K., Nagasawa, H., Abe, M., As, D.J.: Nonpolar cubic AlGaN/GaN heterojunction field-effect transistor on Ar+implanted 3C-SiC (001). Appl. Phys. Lett. 96, 253501 (2010)
Fitzgerald, E.A., Watson, G.P., Proano, R.E., Ast, D.G.: Nucleation mechanisms and the elimination of misfit dislocations at mismatched interfaces by reduction in growth area. J. Appl. Phys. 65, 2220 (1989)
Zubia, D., Hersee, S.D.: The Application of nanostructuring and substrate compliance to the heteroepitaxy of mismatched semiconductor materials. J. Appl. Phys. 85, 6492 (1999)
Ambacher, O., Majewski, J., Miskys, C., Link, A., Hermann, M., Eickhoff, M., Stutzmann, M., Bernardini, F., Fiorentini, V., Tilak, V., Schaff, B., Eastman, L.F.: Pyroelectric properties of Al(In)GaN/GaN hetero- and quantum well structures. J. Phys. Condens. Matter 14, 3399–3434 (2002)
Bernardini, F., Fiorentini, V., Vanderbilt, D.: Spontaneous polarization and piezoelectric constants of III-V nitrides. Phys. Rev. B 56, R10 024 (1997)
Waltereit, P., Brandt, O., Trampert, A., Grahn, H.T., Menninger, J., Reiche, M., Ploog, K.H.: Nitride semiconductors free of electrostatic fields for efficient white light-emitting diodes. Nature 406, 865 (2000)
Schörmann, J., Potthast, S., As, D.J., Lischka, K.: In situ growth regime characterization of cubic GaN using reflection high energy electron diffraction. Appl. Phys. Lett. 90, 041918 (2009)
Novikov, S.V., Stanton, N.M., Campion, R.P., Foxon, C.T., Kent, A.J.: Free-standing zinc-blende (cubic) GaN layers and substrates. J. Crystal Growth 310, 3964 (2008)
Gay, P., Hirsch, P.B., Kelly, A.: The estimation of dislocation densities in metals from x-ray data. Acta Metallurgica 1, 315 (1953)
DeCuir Jr, E.A., Manasreh, M.O., Tschumak, E., Schörmann, J., As, D.J., Lischka, K.: Cubic GaN/AlN multiple quantum well photodetector. Appl. Phys. Lett. 92, 201910 (2008)
Kemper, R.M., Häberlen, M., Schupp, T., Weinl, M., Bürger, M., Ruth, M., Meier, C., Niendorf, T., Maier, H.J., Lischka, K., As, D.J., Lindner, J.K.N.: Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001). Phys. Stat. Sol. (c) 9(3–4), 1028 (2012)
Sun, X.Y., Bommena, R., Burckel, D., Frauenglass, A., Fairchild, M.N., Brueck, S.R.J., Garett, G.A., Wraback, M., Hersee, S.D.: Defect reduction mechanisms in the nanoheteroepitaxy of GaN on SiC. J. of Appl. Phys. 95, 1450 (2004)
Haynes, C.L., Van Duyne, R.P.: A versatile nanofabrication tool for studies of size-dependent nanoparticle optics. J. Phys. Chem. B 105(24), 5599–5611 (2001)
Chassagne, T., Leycuras, A., Balloud, C., Arcade, P., Peyre, H., Juillaguet, S.: Investigation of 2 inch SiC layers grown in a resistively-heated LP-CVD reactor with horizontal hot-walls. Mater. Sci. Forum 457–460, 273–276 (2004)
Cicero, G., Catellani, A., Galli, G.: Interaction of Water Molecules with SiC(001) Surfaces. J. Phys. Chem. B 108, 16518 (2004)
Lindner, J.K.N., Seider, C., Fischer, F., Weinl, M., Stritzker, B.: Regular surface patterns by local swelling induced by He implantation into silicon through nanosphere lithography masks. Nucl. Instr. Meth. B 267, 1394 (2009)
Gogel, D., Weinl, M., Lindner, J.K.N., Stritzker, B.: Plasma modification of nanosphere lithography masks made of polystyrene beads. J. Optoelectron. Adv. Mater. 12, 740 (2010)
Hiller, L., Stauden, T., Kemper, R.M., Lindner, J.K.N., As, D.J., Pezoldt, J.: ECR-etching of submicron and nanometer sized 3C-SiC(100) mesa structures. Mater. Sci. Forum 717–720, 901 (2012)
Kemper, R.M., Hiller, L., Stauden, T., Pezoldt, J., Duschik, K., Niendorf, T., Maier, H.J., Meertens, D., Tillmann, K., As, D.J., Lindner, J.K.N.: Growth of cubic GaN on 3C-SiC/Si (001) nanostructures. J. Cryst. Growth (2012). doi:10.1016/j.jcrysgro.2012.10.011
As, D. J.: Growth and characterization of MBE-grown cubic GaN, \({\text{ In }}_{\text{ x }}\) \({\text{ Ga }_\text{1-x }}\text{ N },\) \({\text{ and }}\) \({\text{ Al }}_{\text{ y }}\) \({\text{ Ga }_\text{1-y }}{\text{ N }}.\) In: Manasreh, M.O. (ed.) Optoelectronic Properties of Semiconductors and Superlattices, Vol. 19, Chap. 9, pp. 323–450. Taylor and Francis, New York (2003)
As, D.J., Potthast, S., Schörmann, J., Li, S.F., Lischka, K., Nagasawa, H., Abe, M.: Molecular Beam Epitaxy of Cubic Group III-Nitrides on free-standing 3C-SiC substrates. Mater. Sci. Forum 527, 1489 (2006)
Northrup, J.E., Neugebauer, J., Feenstra, R.M., Smith, A.R.: Structure of GaN (0001): The laterally contracted Ga bilayer model. Phys. Rev. B 61, 9932 (2000)
Koblmüller, G., Brown, J., Averbeck, R., Riechert, H., Pongratz, P., Speck, J.S.: Continuous evolution of Ga adlayer coverages during plasma-assisted molecular-beam epitaxy of (0001) GaN. Appl. Phys. Lett. 86, 041908 (2005)
Brandt, O., Sun, Y.J., Däweritz, L., Ploog, K.H.: Ga adsorption and desorption kinetics on M-plane GaN. Phys. Rev. B 69, 165326 (2004)
Schikora, D., Hankeln, M., As, D.J., Lischka, K., Litz, T., Waag, A., Buhrow, T., Henneberger, F.: Epitaxial growth and optical transitions of cubic GaN films. Phys. Rev. B 54, 8381 (1996)
Feuillet, G., Hamaguchi, H., Ohta, K., Hacke, P., Okumura, H., Yoshida, S.: Arsenic mediated reconstructions on cubic (001) GaN. Appl. Phys. Lett. 70, 1025 (1997)
Neugebauer, J., Zywietz, Z., Scheffler, M., Northrup, J.E., Van der Walle, C.G.: Clean and As-Covered Zinc-Blende GaN (001) Surfaces: Novel Surface Structures and Surfactant Behavior. Phys. Rev. Lett. 80, 3097 (1998)
Mula, G., Adelmann, C., Moehl, S., Oullier, J., Daudin, B.: Surfactant effect of gallium during molecular-beam epitaxy of GaN on AlN (0001). Phys. Rev. B 64, 195406 (2001)
Adelmann, C., Brault, J., Jalabert, D., Gentile, P., Mariette, H., Mula, G., Daudin, B.: Dynamically stable gallium surface coverages during plasma-assisted molecular-beam epitaxy of (0001) GaN. J. Appl. Phys. 91, 9638 (2002)
Nagayama, A., Sawada, H., Takuma, E., Katayama, R., Onabe, K., Ichinose, H., Shiraki, Y.: Structural study on stacking faults in GaN/GaAs (001) heterostructures. Inst. Phys. Conf. Ser. 170, 749 (2002)
Ayers, J.E.: New model for the thickness and mismatch dependencies of threading dislocation densities in mismatched heteroepitaxial layers. J. Appl. Phys. 78, 3724 (1995)
Okumura, H., Ohta, K., Feuillet, G., Balakrishnan, K., Chichibu, S., Hamaguchi, H., Hacke, P., Yoshida, S.: Growth and characterization of cubic GaN. J. Cryst. Growth 178, 113 (1997)
Daudin, B., Feuillet, G., Hübner, J., Samson, Y., Widmann, F., Philippe, A., Bru-Chevallier, C., Guillot, G., Bustarret, E., Bentoumi, G., Deneuville, A.: How to grow cubic GaN with low hexagonal phase content on (001) SiC by molecular beam epitaxy. J. Appl. Phys. 84, 2295 (1998)
Kemper, R.M., Weinl, M., Kemper, R.M., Weinl, M., Mietze, C., Häberlen, M., Schupp, T., Tschumak, E., Lindner, J.K.N., Lischka, K., As, D.J.: Growth of cubic GaN on nano-patterned 3C-SiC/Si (001) substrates. J. Cryst. Growth 323, 84 (2011)
Taylor, A., Jones, R.M.: The crystal structure and the thermal expansion of cubic and hexagonal silicon carbide, Silicon Carbide-A High Temperature Semiconductor, edited by J.R.O Connor, J. Smiltens, Oxford, Symposium Publications Division, Pergamon Press, 1960, Section III, Chap.1, p.147 (1960)
Strite, S., Juan, J., Li, Z., Salvador, A., Chen, H., Smith, D.J., Choyke, W.J., Morkoc, H., Vac, J.: An investigation of the properties of cubic GaN grown on GaAs by plasma-assisted molecular-beam epitaxy. J. Vac. Sci. Technol. B9(4), 1924 (1991)
Wu, J., Yaguchi, H., Zhang, B.P., Segawa, Y., Onabe, K., Shiraki, Y.: Optical properties of cubic GaN grown on 3C-SiC (100) substrates by metalorganic vapor phase epitaxy. Phys. Stat. Sol. (a) 180, 403 (2000)
Sanorpim, S., Takuma, E., Ichinose, H., Katayama, R., Onabe, K.: Structural transition control of laterally overgrown c-GaN and h-GaN on stripe-patterned GaAs (001) substrates by MOVPE. Phys. Stat. Sol. (b) 244(6), 1769 (2007)
Stadelmann, P.A.: EMS - A software package for electron diffraction analysis and HREM image simulation in materials science. Ultramicroscopy 21(2), 131 (1987)
As, D.J., Schmilgus, F., Wang, C., Schöttker, B., Schikora, D., Lischka, K.: The near band edge photoluminescence of cubic GaN epilayers. Appl. Phys. Lett. 70, 1311 (1997)
Nagasawa, H., Abe, M., Yagi, K., Kawahara, T., Hatta, N.: Fabrication of high performance 3C-SiC vertical MOSFETs by reducing planar defects. Phys. Stat. Sol. (b) 245(7), 1272–1280 (2008)
Kemper, R.M., Schupp, T., Häberlen, M., Niendorf, T., Maier, H.-J., Dempewolf, A., Bertram, F., Christen, J., Kirste, R., Hoffmann, A., Lindner, J., As, D.J.: Anti-phase domains in cubic GaN. J. Appl. Phys. 110, 123512 (2011)
Reimer, L.: Scanning Electron Microscopy, 2nd edn, pp. 368–374. Springer, New York (1998)
Zainal, N., Novikov, S.V., Mellor, C.J., Foxon, C.T., Kent, A.J.: Current-voltage characteristics of zinc-blende (cubic) Al0.3Ga0.7N/GaN double barrier resonant tunneling diodes. Appl. Phys. Lett. 97, 112102 (2010)
Mietze, C., Lischka, K., As, D.J.: Current-voltage characteristics of cubic Al(Ga)N/GaN double barrier structures on 3C-SiC. Phys. Stat. Sol. (a) 209(3), 439 (2012)
Acknowledgments
The authors would like to thank L. Hiller, Th. Stauden and J. Pezoldt (TU Ilmenau) for patterning the substrates with electron beam lithography and reactive ion etching. The authors also wish to thank Th. Niendorf, K. Duschik and H.-J. Maier (University of Paderborn) for EBSD and some of the TEM measurements. We thank M. Ruth and C. Meier (University of Paderborn) for the micro-photoluminescence measurements. Furthermore we thank the team of the Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) at Forschungszentrum Jülich, in particular D. Meertens, M. Luysberg and K. Tillmann for access to and comprehensive support at the FIB and TEM facilities of ER-C. Part of the work at Paderborn was financially supported by German Science Foundation (As(107/4-1)).
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Kemper, R.M., As, D.J., Lindner, J.K.N. (2013). Cubic GaN on Nanopatterned 3C-SiC/Si (001) Substrates. In: Li, H., Wu, J., Wang, Z. (eds) Silicon-based Nanomaterials. Springer Series in Materials Science, vol 187. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-8169-0_15
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