Abstract
This work aims to provide the reader with a comprehensive understanding on the subject of modeling, analyzing and understanding the impact of transistor aging on analog integrated circuits (IC) in a nanometer complementary metal-oxide-semiconductor (CMOS) technology. The first chapter of this work introduces the problem studied and the major subjects addressed in this book.
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© 2013 Springer Science+Business Media New York
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Maricau, E., Gielen, G. (2013). Introduction. In: Analog IC Reliability in Nanometer CMOS. Analog Circuits and Signal Processing. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-6163-0_1
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DOI: https://doi.org/10.1007/978-1-4614-6163-0_1
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Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4614-6162-3
Online ISBN: 978-1-4614-6163-0
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