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Nanoscale Applications for Information and Energy Systems pp 203–253Cite as

Exploring Surfaces of Materials with Atomic Force Microscopy

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Part of the book series: Nanostructure Science and Technology ((NST))

Abstract

Several aspects of Atomic Force Microscopy (AFM) are considered in this chapter. Theoretical backgrounds of AFM, which are based on the asymptotic solution of tip–sample interactions, lead to the classification of modes and computer simulations of images and force curves. Visualization of surface morphology with high resolution is the main AFM application. The practical issues of the high-resolution imaging, tracking of corrugated surfaces, and compositional mapping of multicomponent polymers are illustrated in several examples. The components of heterogeneous systems are recognized by their specific shape or by their different mechanical and electric properties revealed in the AFM-based methods. The challenges of the quantitative nanomechanical studies of soft materials are discussed. The multifrequency examination of local electric/dielectric properties is presented by the single-pass studies of surface potential and dielectric response on various samples.

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Notes

  1. 1.

    The phase contrast is defined differently in the scanning probe microscopes of different manufacturers. In the NTEGRA microscope made by NT-MDT (Zelenograd, Russia), which was used for most of the measurements presented in this chapter, the phase changes through the resonance from −90° to +90°.

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Authors and Affiliations

  1. NT-MDT Development Inc., 430 W. Warner Rd., Tempe, AZ, 85284, USA

    S. Magonov, J. Alexander & S. Belikov

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  1. S. Magonov
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  2. J. Alexander
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  3. S. Belikov
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Correspondence to S. Magonov .

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Editors and Affiliations

  1. Nano and Giga Solutions, Inc., Gilbert, 85296, Arizona, USA

    Anatoli Korkin

  2. Institute for Microstructural Sciences, National Research Council of Canada, Montreal Road, Ottawa, K1A 0R6, Ontario, Canada

    David J. Lockwood

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Magonov, S., Alexander, J., Belikov, S. (2013). Exploring Surfaces of Materials with Atomic Force Microscopy. In: Korkin, A., Lockwood, D. (eds) Nanoscale Applications for Information and Energy Systems. Nanostructure Science and Technology. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-5016-0_7

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