Abstract
This final chapter is designed to show how the instrumentation, theory, and methods of EELS can be combined to extract useful information from TEM specimens, with the possibility of high spatial resolution. As in previous chapters, we begin with low-loss spectroscopy and energy filtering, followed by core-loss analysis and elemental mapping, including factors that determine detection sensitivity and spatial resolution. Structural information obtained through the analysis of spectral fine structure is then discussed, and a final section shows how EELS has been applied to a few selected materials systems. Meanwhile, Table 5.1 lists the information obtainable by energy-loss spectroscopy and by alternative high-resolution methods.
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Notes
- 1.
Freeware available from http://www.astro.princeton.edu/~draine/DDSCAT.html
- 2.
A. Hitchcock and colleagues: http://unicorn.mcmaster.ca/corex/name-list.html
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Egerton, R. (2011). TEM Applications of EELS. In: Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-9583-4_5
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