Abstract
Most test generation schemes look at a CUT as a black box, the only available nodes of which for testers to control are its primary inputs, and to observe one are its primary outputs. This limited controllability and observability of circuits under test (CUT) means complex test generation algorithms for combinational circuits, and near-impossible test generation for the sequential circuits.
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Navabi, Z. (2011). Design for Test by Means of Scan. In: Digital System Test and Testable Design. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-7548-5_7
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DOI: https://doi.org/10.1007/978-1-4419-7548-5_7
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