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The Principles of STEM Imaging

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Book cover Scanning Transmission Electron Microscopy

Abstract

The principles underlying imaging in the scanning transmission electron microscope are described. Particular focus is made on bright-field and annular dark-field imaging modes to illustrate the difference between coherent and incoherent imaging. In the case of annular dark-field imaging, the effects of dynamical diffraction and thermal diffuse scattering are discussed. The extension to three-dimensional imaging by optical sectioning is included, with particular reference to resolution limits and the bounds of transfer.

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Acknowledgements

The author would like to thank the many colleagues and collaborators that have been involved in furthering our understanding of STEM imaging. P.D.N. acknowledges support from the Leverhulme Trust (F/08749/B), Intel Ireland, and the Engineering and Physical Sciences Research Council (EP/F048009/1).

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Authors and Affiliations

  1. Department of Materials, University of Oxford, Oxford, UK

    Peter D. Nellist

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  1. Peter D. Nellist
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Correspondence to Peter D. Nellist .

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Editors and Affiliations

  1. Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, 37831-6056, Tennessee, USA

    Stephen J. Pennycook

  2. , Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom

    Peter D. Nellist

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Nellist, P.D. (2011). The Principles of STEM Imaging. In: Pennycook, S., Nellist, P. (eds) Scanning Transmission Electron Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-7200-2_2

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