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Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications

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Book cover Scanning Probe Microscopy of Functional Materials

Abstract

In this chapter, we review the fundamentals of dynamic force microscopy (DFM) and dynamic force spectroscopy (DFS) focusing on applications in ambient conditions. More specifically, we analyze the basic principles of the two important driving mechanisms that are used in AFM imaging modes:the amplitude-modulation technique (“tapping mode”) and the frequency-modulation technique. From this starting point, analytical descriptions of the two modes are developed. The theory is then applied in conjunction with numerical simulations to various situations occurring while imaging in ambient conditions. Finally, we present methods for the continuous measurement of the tip–sample interaction forces during the approach towards the sample surface using DFS.

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Notes

  1. 1.

    It is also possible to implement the FM-mode with the help of a phase-looked loop (PLL) [17].

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Authors and Affiliations

  1. Institute for Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344, Eggenstein-Leopoldshafen, Germany

    Hendrik Hölscher

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  1. Hendrik Hölscher
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  2. Jan-Erik Schmutz
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  3. Udo D. Schwarz
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Correspondence to Hendrik Hölscher .

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Editors and Affiliations

  1. , NanoTransport Laboratory, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, 37831, Tennessee, USA

    Sergei V. Kalinin

  2. Dept. Materials Science and Engineering, Department of Physics & Astronomy, University of Nebraska - Lincoln, 202 Ferguson Hall 7920, Lincoln, 68588, Nebraska, USA

    Alexei Gruverman

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Hölscher, H., Schmutz, JE., Schwarz, U.D. (2010). Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy of Functional Materials. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-7167-8_3

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