Skip to main content

THz Technology in Nondestructive Evaluation

  • Chapter
  • First Online:
Book cover Introduction to THz Wave Photonics

Abstract

The Nondestructive Evaluation and Testing, in short NDE, discipline includes technologies and methods with the goal to examine objects and materials (samples) without impairing their future use. For example, ultrasounds and X-rays have been used in NDT applications for a long time such as material inspection, medical diagnostics, manufacturing, and quality control. On the other hand, in destructive testing, the sample is damaged during testing process. The destructive testing could be an extreme testing, where the selected samples are tested up to a failure point, then, the behavior of similar samples is statistically extrapolated. Or it can be a nonextreme test, where the sample is dissembled for a better investigation. Examples of destructive testing are found in mechanical elasticity and stress, heat insulation, and corrosion resistance measurements. NDE involves mechanical, optical, or chemical analysis, by use of ultrasonic waves, thermal waves, and electromagnetic waves. The results of applying NDE have a very broad impact on many fields, such as helping the aeronautics industry to ensure the integrity and reliability, and supporting cancer research by finding tumors The implementation of NDE techniques must include, at least, the following components

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 129.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to X. C. Zhang .

Rights and permissions

Reprints and permissions

Copyright information

© 2010 Springer Science+Business Media, LLC

About this chapter

Cite this chapter

Zhang, X.C., Xu, J. (2010). THz Technology in Nondestructive Evaluation. In: Introduction to THz Wave Photonics. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-0978-7_8

Download citation

  • DOI: https://doi.org/10.1007/978-1-4419-0978-7_8

  • Published:

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4419-0977-0

  • Online ISBN: 978-1-4419-0978-7

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics