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© 2007 Springer
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Chiang, C.C., Kawa, J. (2007). Variability & Parametric Yield. In: Design for Manufacturability and Yield for Nano-Scale CMOS. Series on Integrated Circuits and Systems. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-5188-3_5
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DOI: https://doi.org/10.1007/978-1-4020-5188-3_5
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-5187-6
Online ISBN: 978-1-4020-5188-3
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