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Testing of D/A and A/D Converters

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Abstract

This Chapter deals with the methods used for testing and characterizing data converters. We shall start with the static method for testing DNL and INL. Following this, we shall consider the testing of DACs dynamic performances, namely settling time, glitch and distortion. Static ADC testing will also be considered. Subsequently, we shall study the histogram method with different types of input. Distortion and intermodulation tests are also discussed. The use of sine wave and FFT in extracting part specifications is also considered.

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References

Books and Monographs

  • M. Mahoney: Tutorial DSP-Based Testing of Analog and Mixed-Signal Circuits, Computer Society, IEEE, Washington D.C., 1987.

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  • M. Burns and G.W. Roberts: An Introduction to Mixed-Signal IN Test and Measurement, Oxford University Press, New York, 2001.

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Journals and Conference Proceedings

  • J. Doernberg, H. Lee, and D. A. Hodges: Full-speed testing of A/D converters, IEEE Journal of Solid-State Circuits, vol. 19, pp. 820–827, 1984.

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  • M. Burns: High Speed measurements Using Undersampled Delta Modulation, Teradyne User’s Group Proceedings, Teradyne, 1997.

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  • Y. Sun: Analogue and mixed-signal test for systems on chip, Special Session Introduction, IEE Proceedings, Part G, vol. 151, pp 335–336, 2004.

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  • E. Truebenbach: Instruments for Automatic test, IEEE Instrumentation and Measurement Magazine, vol. 8, pp. 27–34, 2005.

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© 2007 Springer

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(2007). Testing of D/A and A/D Converters. In: Data Converters. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-32486-9_9

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  • DOI: https://doi.org/10.1007/978-0-387-32486-9_9

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-387-32485-2

  • Online ISBN: 978-0-387-32486-9

  • eBook Packages: EngineeringEngineering (R0)

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