Abstract
When electromagnetic radiation interacts with microstructures (either isolated or located on a surface) whose size is of the order of the incident wavelength, scattered radiation can be detected in all directions. Furthermore, the electromagnetic characteristics of the scattered wave in a given direction may be changed due to the interaction of the incident radiation with the microstructure. This constitutes an important electromagnetic problem since long time ago and, in order to solve it some information has to be obtained about the physical scattering structure (i.e. size, shape, optical properties, etc). The interest in solving this problem is not only from a basic point of view but for the applications in many fields. For instance, microstructures in volume are common in areas like meteorology, astronomy, biology, radar, atmospheric contamination, optical oceanography, etc.; whereas microstructures on surfaces are common for instance in the semiconductor industry, high reflectance surface contamination, SERS, optical particle sizing, etc. Because of these applications, many researchers have developed theories and numerical methods, and have carried out experiments in order to solve those electromagnetic scattering problems. Recent scientific meetings in close relation with the scattering of electromagnetic waves from microstructures confirm the current interest of the scientific community [1]. A number of issues have been devoted to the subject in some journals [2-4], and also several books of collected works (theoretical and applied) have been edited [5,6].
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González, F., Moreno, F. (2000). Introduction to Light Scattering from Microstructures. In: Moreno, F., González, F. (eds) Light Scattering from Microstructures. Lecture Notes in Physics, vol 534. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-46614-2_1
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