Abstract
X-ray reflectivity (XRR) is a technique for characterizing the structure of thin, multi-layer devices. This section describes the application of the differential evolution (DE) algorithm to automatically and reliably analyze XRR data. A data-fitting method is presented that is conceptually simple, easy to implement and is capable of converging to a global minimum in the parameter space even when there are many additional local minima. The method is quite general and could be applied to many problems in science and engineering.
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Wormington, M., Matney, K.M., Bowen, D.K. (2005). Application of Differential Evolution to the Analysis of X-Ray Reflectivity Data. In: Differential Evolution. Natural Computing Series. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-31306-0_16
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DOI: https://doi.org/10.1007/3-540-31306-0_16
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-20950-8
Online ISBN: 978-3-540-31306-9
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