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Springer Handbook of Nanotechnology pp 605–629Cite as

Scanning Probe Studies of Nanoscale Adhesion Between Solids in the Presence of Liquids and Monolayer Films

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Part of the book series: Springer Handbooks ((SHB))

Abstract

Adhesion between solids is a ubiquitous phenomenon whose importance is magnified at the micrometer and nanometer scales, where the surface-to-volume ratio diverges as we approach the single atom.

Numerous techniques for measuring adhesion at the atomic scale have been developed. Yet significant limitations exist. Instrumental improvements and reliable quantification are still needed.

Recent studies have highlighted the unique and important effect of liquid capillaries, particularly water, at the nanometer scale. The results demonstrate that macroscopic considerations of classic meniscus theory must be, at the very least, corrected to take into account new scaling and geometric relationships unique to the nanometer scale. More generally, a molecular-scale description of wetting and capillary condensation as it applies to nanometer-scale interfaces is clearly desirable, but remains an important challenge.

The measurement of adhesion between self-assembled monolayers has proven to be a reliable means for probing the influence of surface chemistry and local environment on adhesion. To date, however, few systems have been investigated quantitatively in detail. The molecular origins of adhesion down to the single bond level remain to be fully investigated. The most recent studies illustrate that although new information about adhesion in these systems has been revealed, further enhancements of current techniques, as well as the development of new methodologies, coupled with accurate theoretical modeling, are required to adequately tackle these complex measurements.

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Abbreviations

AFM:

atomic force microscope/microscopy

IFM:

interfacial force microscope

JKR:

Johnson–Kendall–Roberts

MEMS:

microelectromechanical systems

NEMS:

nanoelectromechanical systems

OTE:

octadecyltrimethoxysilane

OTS:

octadecyltrichlorosilane

RH:

relative humidity

SAM:

self-assembling monolayer

SFA:

surface forces apparatus

SFM:

scanning force microscopy

STM:

scanning tunneling microscope/microscopy

UHV:

ultrahigh vacuum

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Acknowledgements

We gratefully acknowledge the help of Ms. Erin Flater, who provided valuable assistance and insights into the literature on capillary formation. RWC acknowledges support of a career award from the National Science Foundation, grant #CMS-0134571.

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Authors and Affiliations

  1. Department of Engineering Physics, University of Wisconsin-Madison, 1500 Engineering Drive, 53706-1687, Madison, WI, USA

    Robert W. Carpick Prof.

  2. Surface and Microanalysis Science Division, National Institute of Standards and Technology, 100 Bureau Drive Mailstop 8372, 20899-8372, Gaithersburg, MD, USA

    James D. Batteas Dr.

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  1. Robert W. Carpick Prof.
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  2. James D. Batteas Dr.
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  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS, The Ohio State University, 206 W. 18th Avenue, 43210-1107, Columbus, OH, USA

    Bharat Bhushan Prof.

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Carpick, R.W., Batteas, J.D. (2004). Scanning Probe Studies of Nanoscale Adhesion Between Solids in the Presence of Liquids and Monolayer Films. In: Bhushan, B. (eds) Springer Handbook of Nanotechnology. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-29838-X_19

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  • DOI: https://doi.org/10.1007/3-540-29838-X_19

  • Publisher Name: Springer, Berlin, Heidelberg

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  • Online ISBN: 978-3-540-29838-0

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