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Applied Scanning Probe Methods II pp 91–119Cite as

Scanning Ion Conductance Microscopy

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Authors and Affiliations

  1. Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Gievenbecker Weg 11, 48149, Münster, Germany

    Tilman E. Schäffer & Harald Fuchs

  2. nanoAnalytics GmbH, Gievenbecker Weg 11, 48149, Münster, Germany

    Boris Anczykowski

Authors
  1. Tilman E. Schäffer
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  2. Boris Anczykowski
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  3. Harald Fuchs
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Editors and Affiliations

  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, 650 Ackerman Road, Suite 255, Columbus, OH, 43202-1107, USA

    Bharat Bhushan

  2. Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Gievenbecker Weg 11, 48149, Münster, Germany

    Harald Fuchs

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© 2006 Springer-Verlag Berlin Heidelberg

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Schäffer, T.E., Anczykowski, B., Fuchs, H. (2006). Scanning Ion Conductance Microscopy. In: Bhushan, B., Fuchs, H. (eds) Applied Scanning Probe Methods II. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-27453-7_3

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