Abstract
Structural test programs are used in production test in order to reduce the time taken to test the fabricated IC when compared to an exhaustive functional test. Structural tests are based on the development of test vectors to detect specific faults that are considered to exist in a circuit due to process defects. The generation of the necessary test vectors is undertaken using test pattern generation and fault simulation techniques and tools.
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(2006). Test Pattern Generation and Fault Simulation. In: Integrated Circuit Test Engineering. Springer, London. https://doi.org/10.1007/1-84628-173-3_10
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DOI: https://doi.org/10.1007/1-84628-173-3_10
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