Abstract
Hailed as the “NMR of the periodic table,” X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is one of the most powerful and common chemical analysis techniques. XPS is based on the photoelectric effect in which the binding energy (E B) of a corelevel electron is overcome by the energy (hν) of an impinging soft X-ray photon, and the core-level electron is excited and ejected from the analyte. The kinetic energies of the ejected photoelectrons, E K, are measured by an electron spectrometer whose work function is φ. Invoking conservation of energy, the following relationship is obtained:
Keywords
- Ultraviolet Photoelectron Spectroscopy
- Binding Energy Scale
- Electron Energy Analyzer
- Orbital Angular Momentum Quantum Number
- Reflect Electron Energy Loss Spectroscopy
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
Ratner, B.D. & Castner, D.G. (1997) Surface analysis: The principal techniques JC Vickerman (Chichester [England]; New York: John Wiley) p 43–98.
Einstein, A. (1905) Annalen der Physik 17, 132–148.
Sokolowski, E., Nordling, C. & Siegbahn, K. (1958) Physical Review 110, 776.
Hagstrom, S., Nordling, C. & Siegbahn, K. (1964) Physics Letters 9, 235–236.
Nordling, C., Hagstrom, S. & Siegbahn, K. (1964) Zeitschrift fuer Physik 178, 433–438.
Siegbahn, K., Hammond, D., Fellner-Feldegg, H. & Barnett, E.F. (1972) Science 176, 245–252.
Siegbahn, K. (1982) Science 217, 111–121.
Briggs, D. & Grant, J.T. (2003) In Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy (pp. 1–30).
Barr, T.L. (1994) Modern ESCA The Principles and Practice of X-Ray Photoelectron Spectroscopy Boca Raton: CRC Press.
Watts, J.F. & Wolstenholme, J. (2003) An Introduction to Surface Analysis by XPS and AES (Chichester, West Sussex; New York, NY: J. Wiley) Vol. X.
Moulder, J.F., Stickle, W.F. & Sobol, P.E. (1993) Handbook of X-Ray Photoelectron Spectroscopy (Eden Prairie, Minn.: Perkin-Elmer, Physical Electronics Division).
http://www.thermo.com/com/cda/product/detail/1, 15955,00.html.
Kinoshita, T. (2002) J. Electron Spectrosc. Relat. Phenom. 124, 175–194.
Leckey, R. (2003) Springer Series in Surface Sciences 23, 337–345.
Oswald, S. & Baunack, S. (2003) Thin Solid Films 425, 9–19.
Margaritondo, G. (2003) In Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy pp. 733–748.
Fulghum, J.E. (1999) Journal of Surface Analysis 6, 13–21.
Ertas, G., Korcan Demirok, U. & Suzer, S. (2005) Appl. Surf. Sci. 249, 12–15.
Oyama, T., Nishizawa, S. & Yamamoto, H. (1997) Journal of Surface Analysis 3, 558–564.
Kelly, M.A. (2003) In Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy. (pp. 191–210).
Turner, N.H. & Schreifels, J.A. (2000) Anal. Chem. 72, 99R–110R.
Havercroft, N.J. & Sherwood, P.M.A. (1998) J. Vac. Sci. Technol., A 16, 1112–1116.
Fiedor, J.N., Proctor, A., Houalla, M., Sherwood, P.M.A., Mulcahy, F.M. & Hercules, D.M. (1992) J. Phys. Chem. 96, 10967–10970.
Flamia, R., Lanza, G., Salvi, A.M., Castle, J.E. & Tamburro, A.M. (2005) Biomacromolecules 6, 1299–1309.
Scrocco, M. (1979) Chem. Phys. Lett. 63, 52–56.
Seah, M.P. (2001) Surf. Sci. 471, 185–202.
http://srdata.nist.gov/xps/.
Kover, L. (2003) In Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy (pp. 421–464).
Scholl, A., Zou, Y., Jung, M., Schmidt, T., Fink, R. & Umbach, E. (2004) J. Chem. Phys. 121, 10260–10267.
Vohrer, U., Blomfield, C., Page, S. & Roberts, A. (2005) Appl. Surf. Sci. 252, 61–65.
Reniers, F. & Tewell, C. (2005) J. Electron Spectrosc. Relat. Phenom. 142, 1–25.
Escher, M. et al. (2005) J. Electron Spectrosc. Relat. Phenom. 144–147, 1179–1182.
Blomfield, C.J. (2005) J. Electron Spectrosc. Relat. Phenom. 143, 241–249.
Balss, K.M., Coleman, B.D., Lansford, C.H., Haasch, R.T. & Bohn, P.W. (2001) J. Phys. Chem. B 105, 8970–8978.
Ghosh, P.K. (1983) Introduction to Photoelectron Spectroscopy (New York: Wiley) Vol. X.
Baunach, T., Ivanova, V., Kolb, D.M., Boyen, H.-G., Ziemann, P., Buettner, M. & Oelhafen, P. (2004) Adv. Mater. 16, 2024–2028.
Ye, S., Li, G., Noda, H., Uosaki, K. & Osawa, M. (2003) Surf. Sci. 529, 163–170.
Doron-Mor, I., Hatzor, A., Vaskevich, A., Van Der Boom-Moavt, T., Shanzer, A., Rubinstein, I. & Cohen, H. (2000) Nature 406, 382–385.
Paolucci, G. (2001) J. Phys.: Condens. Matter 13, 11293–11303.
Baraldi, A., Comelli, G., Lizzit, S., Kiskinova, M. & Paolucci, G. (2003) Surf. Sci. Rep. 49, 169–224.
Lee, A.F., Wilson, K., Middleton, R.L., Baraldi, A., Goldoni, A., Paolucci, G. & Lambert, R.M. (1999) J. Am. Chem. Soc. 121, 7969–7970.
Cropley, R.L., Williams, F.J., Urquharta, A.J., Vaughan, O.P.H., Tikhov, M.S. & Lambert, R.M. (2005) J. Am. Chem. Soc. 127, 6069–6076.
Demirok, U.K., Ertas, G. & Suzer, S. (2004) J. Phys. Chem. B 108, 5179–5181.
Siegbahn, H., Asplund, L., Kelfve, P. & Siegbahn, K. (1975) J. Electron Spectrosc. Relat. Phenom. 7, 411–419.
Fellner-Feldegg, H., Siegbahn, H., Asplund, L., Kelfve, P. & Siegbahn, K. (1975) J. Electron Spectrosc. Relat. Phenom. 7 421–428.
Siegbahn, H. & Siegbahn, K. (1973) J. Electron Spectrosc. Relat. Phenom. 2, 319–325.
Ogletree, D.F., Bluhm, H., Lebedev, G., Fadley, C.S., Hussain, Z. & Salmeron, M. (2002) Rev. Sci. Instrum. 73, 3872–3877.
Ghosal, S., Hemminger, J.C., Bluhm, H., Mun, B.S., Hebenstreit, E.L.D, Ketteler, G., Ogletree, D.F., Requejo, F.G. & Salmeron, M. (2005) Science 307, 563–566.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2006 Springer
About this chapter
Cite this chapter
Lee, HL., Flynn, N.T. (2006). X-RAY PHOTOELECTRON SPECTROSCOPY. In: Vij, D. (eds) Handbook of Applied Solid State Spectroscopy. Springer, Boston, MA. https://doi.org/10.1007/0-387-37590-2_11
Download citation
DOI: https://doi.org/10.1007/0-387-37590-2_11
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-32497-5
Online ISBN: 978-0-387-37590-8
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)