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Gizopoulos / Advances in ElectronicTesting pp 109–139Cite as

Delay Testing

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Part of the book series: Frontiers in Electronic Testing ((FRET,volume 27))

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Author information

Authors and Affiliations

  1. Test Automation, Synopsys, Inc, Mountain View, CA, USA

    Adam Cron

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  1. Adam Cron
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Editor information

Editors and Affiliations

  1. University of Piraeus, Greece

    Dimitris Gizopoulos

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© 2006 Springer

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Cron, A. (2006). Delay Testing. In: Gizopoulos, D. (eds) Gizopoulos / Advances in ElectronicTesting. Frontiers in Electronic Testing, vol 27. Springer, Boston, MA. https://doi.org/10.1007/0-387-29409-0_4

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  • DOI: https://doi.org/10.1007/0-387-29409-0_4

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-387-29408-7

  • Online ISBN: 978-0-387-29409-4

  • eBook Packages: EngineeringEngineering (R0)

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