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© 2002 Kluwer Academic Publishers
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(2002). Digital DFT and Scan Design. In: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits. Frontiers in Electronic Testing, vol 17. Springer, Boston, MA. https://doi.org/10.1007/0-306-47040-3_14
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DOI: https://doi.org/10.1007/0-306-47040-3_14
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-7923-7991-1
Online ISBN: 978-0-306-47040-0
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