Abstract
High resolution electron microscopy (HREM) images are sensitive to focus, astigmatism and crystal orientation. Only images of weak-phase-objects which are taken near the Scherzer focus of a microscope can be directly interpreted in terms of projected potential of the crystal. Furthermore, crystals have to be well aligned. Here we will present how to use crystallographic image processing to compensate for distortions caused by noise, defocus, astigmatism and crystal misalignment. The amplitudes and phases after the CTF and crystal tilt correction can be used for crystal structure determination.
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References
Zou X.D. (1995) Electron Crystallography of inorganic Structures - Theory and Practice, Chemical Communication 5, (Ph.D. thesis).
O’Keefe, M.A. (1992) “Resolution” in high-resolution electron microscopy, Ultramicroscopy 47, 282–297.
Zou X.D., Sundberg M., Larine M. and Hovmöller S. (1996) Structure projection retrieval by image processing of HREM images taken under non-optimal defocus conditions, Ultramicroscopy 62, 103–121
Hovmöller, S., Sjögren, A., Farrants, G., Sundberg, M. and Marinder, B.-O. (1984) Accurate atomic positions from electron microscopy, Nature (London) 311, 238–241.
Han, F.S., Fan, H.F. and Li, F.H. (1986) Image processing in high-resolution electron microscopy using the direct method. II. Image deconvolution, Acta Cryst. A42, 353–356.
Hu, J.J. and Li, H.F. (1991) Maximum entropy image deconvolution in high resolution electron microscopy, Ultramicroscopy 35, 339–350.
Krivanek, O.L. (1976) A method for determining the coefficient of spherical aberration from a single electron micrograph, Optik 45, 96–101.
O’Keefe, M.A. and Radmilovic, V. (1994) Specimen thickness is wrong in simulated HRTEM images, Proceedings of the 13th ICEM (Paris) Vol. 2B, 361–262.
Zou X.D., Ferrow E.A. and Hovmöller S. (1995), Correcting for crystal tilt in HRTEM images of minerals: the case of orthopyroxene, Physics and Chemistry of Minerals 22, 517–523.
Hu, J.J., Li, F.H. and Fan, H.F. (1992) Crystal structure determination of K20.7Nb205 by combining high-resolution electron microscopy and electron diffraction, Ultramicroscopy 41, 387–397.
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© 1997 Springer Science+Business Media Dordrecht
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Zou, X.D. (1997). Crystal Structure Determination by Crystallographic Image Processing: II. Compensate for defocus, astigmatism and crystal tilt . In: Dorset, D.L., Hovmöller, S., Zou, X. (eds) Electron Crystallography. NATO ASI Series, vol 347. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-8971-0_13
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DOI: https://doi.org/10.1007/978-94-015-8971-0_13
Publisher Name: Springer, Dordrecht
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