Deterministic Test Pattern Generator Design

  • Gregor Papa
  • Tomasz Garbolino
  • Franc Novak
Conference paper

DOI: 10.1007/978-3-540-78761-7_21

Part of the Lecture Notes in Computer Science book series (LNCS, volume 4974)
Cite this paper as:
Papa G., Garbolino T., Novak F. (2008) Deterministic Test Pattern Generator Design. In: Giacobini M. et al. (eds) Applications of Evolutionary Computing. EvoWorkshops 2008. Lecture Notes in Computer Science, vol 4974. Springer, Berlin, Heidelberg

Abstract

This paper presents a deterministic test pattern generator structure design based on genetic algorithm. The test pattern generator is composed of a linear register and a non-linear combinational function. This is very suitable solution for on-line built-in self-test implementations where functional units are tested in their idle cycles. In contrast to conventional approaches our multi-objective approach reduces the gate count of built-in self-test structure by concurrent optimization of multiple parameters that influence the final solution.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2008

Authors and Affiliations

  • Gregor Papa
    • 1
  • Tomasz Garbolino
    • 2
  • Franc Novak
    • 1
  1. 1.Jožef Stefan InstituteLjubljanaSlovenia
  2. 2.Silesian University of TechnologyGliwicePoland

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