Large-Scale Transient Sensitivity Analysis of a Radiation-Damaged Bipolar Junction Transistor via Automatic Differentiation

  • Eric T. Phipps
  • Roscoe A. Bartlett
  • David M. Gay
  • Robert J. Hoekstra
Conference paper

DOI: 10.1007/978-3-540-68942-3_31

Part of the Lecture Notes in Computational Science and Engineering book series (LNCSE, volume 64)
Cite this paper as:
Phipps E.T., Bartlett R.A., Gay D.M., Hoekstra R.J. (2008) Large-Scale Transient Sensitivity Analysis of a Radiation-Damaged Bipolar Junction Transistor via Automatic Differentiation. In: Bischof C.H., Bücker H.M., Hovland P., Naumann U., Utke J. (eds) Advances in Automatic Differentiation. Lecture Notes in Computational Science and Engineering, vol 64. Springer, Berlin, Heidelberg

Summary

Automatic differentiation (AD) is useful in transient sensitivity analysis of a computational simulation of a bipolar junction transistor subject to radiation damage. We used forward-mode AD, implemented in a new Trilinos package called Sacado, to compute analytic derivatives for implicit time integration and forward sensitivity analysis. Sacado addresses element-based simulation codes written in C++ and works well with forward sensitivity analysis as implemented in the Trilinos time-integration package Rythmos. The forward sensitivity calculation is significantly more efficient and robust than finite differencing.

Keywords

Sensitivity analysis radiation damage bipolar junction transistor forward mode Trilinos Sacado Rythmos 

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Copyright information

© Springer-Verlag Berlin Heidelberg 2008

Authors and Affiliations

  • Eric T. Phipps
    • 1
  • Roscoe A. Bartlett
    • 1
  • David M. Gay
    • 1
  • Robert J. Hoekstra
    • 1
  1. 1.Sandia National LaboratoriesAlbuquerqueUSA

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